XPS analysis and luminescence properties of thin films deposited by the pulsed laser deposition technique
J. J. Dolo
, H. C. Swart
, E. Coetsee
, J. J. Terblans
, O. M. Ntwaeaborwa
, B. F. Dejene
University of The Free State
Research output: Contribution to journal › Article › peer-review
6Citations
(Scopus)
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