X-ray photoelectron spectroscopy analysis for undegraded and degraded Gd 2O 2S:Tb 3+ phosphor thin films

J. J. Dolo; H. C. Swart; J. J. Terblans; E. Coetsee; O. M. Ntwaeaborwa; B. F. Dejene

doi:10.1016/j.physb.2011.09.092

X-ray photoelectron spectroscopy analysis for undegraded and degraded Gd ₂O ₂S:Tb ³⁺ phosphor thin films

J. J. Dolo, H. C. Swart, J. J. Terblans, E. Coetsee, O. M. Ntwaeaborwa, B. F. Dejene

University of The Free State

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

Abstract

This paper presents the X-ray Photoelectron Spectroscopy (XPS) analysis for the undegraded and degraded Gd ₂O ₂S:Tb ³⁺ thin film phosphor. The thin films were grown with the pulsed laser deposition (PLD) technique. XPS measurements were done on Gd ₂O ₂S:Tb ³⁺ phosphor thin films before and after electron degradation. The XPS technique has proven the presence of Gd ₂O ₃ on the degraded and undegraded thin film spots. The presence of the SO ₂ bonding was also detected after degradation. This clearly indicates that surface reactions did occur during prolonged electron bombardment in an oxygen atmosphere.

Original language	English
Pages (from-to)	1586-1590
Number of pages	5
Journal	Physica B: Condensed Matter
Volume	407
Issue number	10
DOIs	https://doi.org/10.1016/j.physb.2011.09.092
Publication status	Published - 15 May 2012
Externally published	Yes

Keywords

CL
Electron degradation
Gd O S:Tb
PL
PLD
Thin films
XPS

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Electrical and Electronic Engineering

Access to Document

10.1016/j.physb.2011.09.092

Cite this

@article{8068601ee9244d22bb8ff8d2bf2f462b,

title = "X-ray photoelectron spectroscopy analysis for undegraded and degraded Gd 2O 2S:Tb 3+ phosphor thin films",

abstract = "This paper presents the X-ray Photoelectron Spectroscopy (XPS) analysis for the undegraded and degraded Gd 2O 2S:Tb 3+ thin film phosphor. The thin films were grown with the pulsed laser deposition (PLD) technique. XPS measurements were done on Gd 2O 2S:Tb 3+ phosphor thin films before and after electron degradation. The XPS technique has proven the presence of Gd 2O 3 on the degraded and undegraded thin film spots. The presence of the SO 2 bonding was also detected after degradation. This clearly indicates that surface reactions did occur during prolonged electron bombardment in an oxygen atmosphere.",

keywords = "CL, Electron degradation, Gd O S:Tb, PL, PLD, Thin films, XPS",

author = "Dolo, {J. J.} and Swart, {H. C.} and Terblans, {J. J.} and E. Coetsee and Ntwaeaborwa, {O. M.} and Dejene, {B. F.}",

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T1 - X-ray photoelectron spectroscopy analysis for undegraded and degraded Gd 2O 2S:Tb 3+ phosphor thin films

AU - Dolo, J. J.

AU - Swart, H. C.

AU - Terblans, J. J.

AU - Coetsee, E.

AU - Ntwaeaborwa, O. M.

AU - Dejene, B. F.

PY - 2012/5/15

Y1 - 2012/5/15

N2 - This paper presents the X-ray Photoelectron Spectroscopy (XPS) analysis for the undegraded and degraded Gd 2O 2S:Tb 3+ thin film phosphor. The thin films were grown with the pulsed laser deposition (PLD) technique. XPS measurements were done on Gd 2O 2S:Tb 3+ phosphor thin films before and after electron degradation. The XPS technique has proven the presence of Gd 2O 3 on the degraded and undegraded thin film spots. The presence of the SO 2 bonding was also detected after degradation. This clearly indicates that surface reactions did occur during prolonged electron bombardment in an oxygen atmosphere.

AB - This paper presents the X-ray Photoelectron Spectroscopy (XPS) analysis for the undegraded and degraded Gd 2O 2S:Tb 3+ thin film phosphor. The thin films were grown with the pulsed laser deposition (PLD) technique. XPS measurements were done on Gd 2O 2S:Tb 3+ phosphor thin films before and after electron degradation. The XPS technique has proven the presence of Gd 2O 3 on the degraded and undegraded thin film spots. The presence of the SO 2 bonding was also detected after degradation. This clearly indicates that surface reactions did occur during prolonged electron bombardment in an oxygen atmosphere.

KW - CL

KW - Electron degradation

KW - Gd O S:Tb

KW - PL

KW - PLD

KW - Thin films

KW - XPS

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DO - 10.1016/j.physb.2011.09.092

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