Validation of sentinel-2 leaf area index (LAI) product derived from SNAP toolbox and its comparison with global LAI products in an African semi-arid agricultural landscape

Mahlatse Kganyago, Paidamwoyo Mhangara, Thomas Alexandridis, Giovanni Laneve, Georgios Ovakoglou, Nosiseko Mashiyi

Research output: Contribution to journalArticlepeer-review

58 Citations (Scopus)

Abstract

This study validated SNAP-derived LAI from Sentinel-2 and its consistency with existing global LAI products. The validation and inter-comparison experiments were performed on two processing levels, i.e., Top-of-Atmosphere and Bottom-of-Atmosphere reflectances and two spatial resolutions, i.e., 10 m, and 20 m. These were chosen to determine their effect on retrieved LAI accuracy and consistency. The results showed moderate R 2, i.e., ~0.6 to ~0.7 between SNAP-derived LAI and in-situ LAI, but with high errors, i.e., RMSE, BIAS, and MAE >2 m2 m–2 with marked differences between processing levels and insignificant differences between spatial resolutions. In contrast, inter-comparison of SNAP-derived LAI with MODIS and Proba-V LAI products revealed moderate to high consistencies, i.e., R 2 of ~0.55 and ~0.8 respectively, and RMSE of ~0.5 m2 m–2 and ~0.6 m2 m–2, respectively. The results in this study have implications for future use of SNAP-derived LAI from Sentinel-2 in agricultural landscapes, suggesting its global applicability that is essential for large-scale agricultural monitoring. However, enormous errors in characterizing field-level LAI variability indicate that SNAP-derived LAI is not suitable for precision farming. In fact, from the study, the need for further improvement of LAI retrieval arises, especially to support farm-level agricultural management decisions.

Original languageEnglish
Pages (from-to)883-892
Number of pages10
JournalRemote Sensing Letters
Volume11
Issue number10
DOIs
Publication statusPublished - 2 Oct 2020
Externally publishedYes

ASJC Scopus subject areas

  • Earth and Planetary Sciences (miscellaneous)
  • Electrical and Electronic Engineering

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