Two-Dimensional Fast Fourier Transform Analysis of Surface Microstructures of Thin Aluminium Films Prepared by Radio-Frequency (RF) Magnetron Sputtering

Fredrick M. Mwema; Esther T. Akinlabi; Oluseyi P. Oladijo

doi:10.1007/978-981-13-8297-0_27

Two-Dimensional Fast Fourier Transform Analysis of Surface Microstructures of Thin Aluminium Films Prepared by Radio-Frequency (RF) Magnetron Sputtering

Fredrick M. Mwema, Esther T. Akinlabi, Oluseyi P. Oladijo

Mechanical Engineering Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Citations (Scopus)

Abstract

The purpose of this article is to illustrate the use of two-dimensional fast Fourier transform (2D-FFT) algorithm to describe the properties of aluminium thin films. To do so, the microstructures of thin Al films deposited on stainless steel substrates though radio-frequency (RF) magnetron sputtering are analysed using two-dimensional fast Fourier transform (2D-FFT) algorithm. Field emission scanning electron microscope (FESEM) and atomic force microscope (AFM) images obtained on the surfaces of the films are taken through different image analysis processes. The power spectra are described in terms of spatial frequencies, wavelengths and light intensities in the reciprocal space for both SEM and AFM images. The results of power spectra obtained from FESEM and AFM micrographs are compared for two different cases-films deposited at 200 and 300 W at the same substrate temperature (100 °C). We observe that the 2D-FFT analysis of both SEM and AFM methods can describe (in more details) the distribution of surface structures in thin aluminium films.

Original language	English
Title of host publication	Advances in Material Sciences and Engineering, ICMMPE 2018
Editors	Mokhtar Awang, Seyed Sattar Emamian, Farazila Yusof
Publisher	Springer Science and Business Media Deutschland GmbH
Pages	239-249
Number of pages	11
ISBN (Print)	9789811382963
DOIs	https://doi.org/10.1007/978-981-13-8297-0_27
Publication status	Published - 2020
Event	4th International Conference on Mechanical, Manufacturing and Plant Engineering, ICMMPE 2018 - Melaka, Malaysia Duration: 14 Nov 2018 → 15 Nov 2018

Publication series

Name	Lecture Notes in Mechanical Engineering
ISSN (Print)	2195-4356
ISSN (Electronic)	2195-4364

Conference

Conference	4th International Conference on Mechanical, Manufacturing and Plant Engineering, ICMMPE 2018
Country/Territory	Malaysia
City	Melaka
Period	14/11/18 → 15/11/18

Keywords

Aluminium thin films
Atomic force microscopy (AFM)
Fast Fourier transform (FFT)
Field emission electron microscopy (FESEM)
Image analysis
Sputtering

ASJC Scopus subject areas

Automotive Engineering
Aerospace Engineering
Mechanical Engineering
Fluid Flow and Transfer Processes

Access to Document

10.1007/978-981-13-8297-0_27

Cite this

Mwema, F. M., Akinlabi, E. T., & Oladijo, O. P. (2020). Two-Dimensional Fast Fourier Transform Analysis of Surface Microstructures of Thin Aluminium Films Prepared by Radio-Frequency (RF) Magnetron Sputtering. In M. Awang, S. S. Emamian, & F. Yusof (Eds.), Advances in Material Sciences and Engineering, ICMMPE 2018 (pp. 239-249). (Lecture Notes in Mechanical Engineering). Springer Science and Business Media Deutschland GmbH. https://doi.org/10.1007/978-981-13-8297-0_27

Mwema, Fredrick M. ; Akinlabi, Esther T. ; Oladijo, Oluseyi P. / Two-Dimensional Fast Fourier Transform Analysis of Surface Microstructures of Thin Aluminium Films Prepared by Radio-Frequency (RF) Magnetron Sputtering. Advances in Material Sciences and Engineering, ICMMPE 2018. editor / Mokhtar Awang ; Seyed Sattar Emamian ; Farazila Yusof. Springer Science and Business Media Deutschland GmbH, 2020. pp. 239-249 (Lecture Notes in Mechanical Engineering).

@inproceedings{514ade55110543caa9b4cf94e72356da,

title = "Two-Dimensional Fast Fourier Transform Analysis of Surface Microstructures of Thin Aluminium Films Prepared by Radio-Frequency (RF) Magnetron Sputtering",

abstract = "The purpose of this article is to illustrate the use of two-dimensional fast Fourier transform (2D-FFT) algorithm to describe the properties of aluminium thin films. To do so, the microstructures of thin Al films deposited on stainless steel substrates though radio-frequency (RF) magnetron sputtering are analysed using two-dimensional fast Fourier transform (2D-FFT) algorithm. Field emission scanning electron microscope (FESEM) and atomic force microscope (AFM) images obtained on the surfaces of the films are taken through different image analysis processes. The power spectra are described in terms of spatial frequencies, wavelengths and light intensities in the reciprocal space for both SEM and AFM images. The results of power spectra obtained from FESEM and AFM micrographs are compared for two different cases-films deposited at 200 and 300 W at the same substrate temperature (100 °C). We observe that the 2D-FFT analysis of both SEM and AFM methods can describe (in more details) the distribution of surface structures in thin aluminium films.",

keywords = "Aluminium thin films, Atomic force microscopy (AFM), Fast Fourier transform (FFT), Field emission electron microscopy (FESEM), Image analysis, Sputtering",

author = "Mwema, {Fredrick M.} and Akinlabi, {Esther T.} and Oladijo, {Oluseyi P.}",

note = "Publisher Copyright: {\textcopyright} 2020, Springer Nature Singapore Pte Ltd.; 4th International Conference on Mechanical, Manufacturing and Plant Engineering, ICMMPE 2018 ; Conference date: 14-11-2018 Through 15-11-2018",

year = "2020",

doi = "10.1007/978-981-13-8297-0_27",

language = "English",

isbn = "9789811382963",

series = "Lecture Notes in Mechanical Engineering",

publisher = "Springer Science and Business Media Deutschland GmbH",

pages = "239--249",

editor = "Mokhtar Awang and Emamian, {Seyed Sattar} and Farazila Yusof",

booktitle = "Advances in Material Sciences and Engineering, ICMMPE 2018",

address = "Germany",

}

Mwema, FM, Akinlabi, ET & Oladijo, OP 2020, Two-Dimensional Fast Fourier Transform Analysis of Surface Microstructures of Thin Aluminium Films Prepared by Radio-Frequency (RF) Magnetron Sputtering. in M Awang, SS Emamian & F Yusof (eds), Advances in Material Sciences and Engineering, ICMMPE 2018. Lecture Notes in Mechanical Engineering, Springer Science and Business Media Deutschland GmbH, pp. 239-249, 4th International Conference on Mechanical, Manufacturing and Plant Engineering, ICMMPE 2018, Melaka, Malaysia, 14/11/18. https://doi.org/10.1007/978-981-13-8297-0_27

Two-Dimensional Fast Fourier Transform Analysis of Surface Microstructures of Thin Aluminium Films Prepared by Radio-Frequency (RF) Magnetron Sputtering. / Mwema, Fredrick M.; Akinlabi, Esther T.; Oladijo, Oluseyi P.
Advances in Material Sciences and Engineering, ICMMPE 2018. ed. / Mokhtar Awang; Seyed Sattar Emamian; Farazila Yusof. Springer Science and Business Media Deutschland GmbH, 2020. p. 239-249 (Lecture Notes in Mechanical Engineering).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Two-Dimensional Fast Fourier Transform Analysis of Surface Microstructures of Thin Aluminium Films Prepared by Radio-Frequency (RF) Magnetron Sputtering

AU - Mwema, Fredrick M.

AU - Akinlabi, Esther T.

AU - Oladijo, Oluseyi P.

PY - 2020

Y1 - 2020

N2 - The purpose of this article is to illustrate the use of two-dimensional fast Fourier transform (2D-FFT) algorithm to describe the properties of aluminium thin films. To do so, the microstructures of thin Al films deposited on stainless steel substrates though radio-frequency (RF) magnetron sputtering are analysed using two-dimensional fast Fourier transform (2D-FFT) algorithm. Field emission scanning electron microscope (FESEM) and atomic force microscope (AFM) images obtained on the surfaces of the films are taken through different image analysis processes. The power spectra are described in terms of spatial frequencies, wavelengths and light intensities in the reciprocal space for both SEM and AFM images. The results of power spectra obtained from FESEM and AFM micrographs are compared for two different cases-films deposited at 200 and 300 W at the same substrate temperature (100 °C). We observe that the 2D-FFT analysis of both SEM and AFM methods can describe (in more details) the distribution of surface structures in thin aluminium films.

AB - The purpose of this article is to illustrate the use of two-dimensional fast Fourier transform (2D-FFT) algorithm to describe the properties of aluminium thin films. To do so, the microstructures of thin Al films deposited on stainless steel substrates though radio-frequency (RF) magnetron sputtering are analysed using two-dimensional fast Fourier transform (2D-FFT) algorithm. Field emission scanning electron microscope (FESEM) and atomic force microscope (AFM) images obtained on the surfaces of the films are taken through different image analysis processes. The power spectra are described in terms of spatial frequencies, wavelengths and light intensities in the reciprocal space for both SEM and AFM images. The results of power spectra obtained from FESEM and AFM micrographs are compared for two different cases-films deposited at 200 and 300 W at the same substrate temperature (100 °C). We observe that the 2D-FFT analysis of both SEM and AFM methods can describe (in more details) the distribution of surface structures in thin aluminium films.

KW - Aluminium thin films

KW - Atomic force microscopy (AFM)

KW - Fast Fourier transform (FFT)

KW - Field emission electron microscopy (FESEM)

KW - Image analysis

KW - Sputtering

UR - http://www.scopus.com/inward/record.url?scp=85075711468&partnerID=8YFLogxK

U2 - 10.1007/978-981-13-8297-0_27

DO - 10.1007/978-981-13-8297-0_27

M3 - Conference contribution

AN - SCOPUS:85075711468

SN - 9789811382963

T3 - Lecture Notes in Mechanical Engineering

SP - 239

EP - 249

BT - Advances in Material Sciences and Engineering, ICMMPE 2018

A2 - Awang, Mokhtar

A2 - Emamian, Seyed Sattar

A2 - Yusof, Farazila

PB - Springer Science and Business Media Deutschland GmbH

T2 - 4th International Conference on Mechanical, Manufacturing and Plant Engineering, ICMMPE 2018

Y2 - 14 November 2018 through 15 November 2018

ER -

Mwema FM, Akinlabi ET, Oladijo OP. Two-Dimensional Fast Fourier Transform Analysis of Surface Microstructures of Thin Aluminium Films Prepared by Radio-Frequency (RF) Magnetron Sputtering. In Awang M, Emamian SS, Yusof F, editors, Advances in Material Sciences and Engineering, ICMMPE 2018. Springer Science and Business Media Deutschland GmbH. 2020. p. 239-249. (Lecture Notes in Mechanical Engineering). doi: 10.1007/978-981-13-8297-0_27

Two-Dimensional Fast Fourier Transform Analysis of Surface Microstructures of Thin Aluminium Films Prepared by Radio-Frequency (RF) Magnetron Sputtering

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