Transport measurements in SISNSIS single-electron transistors

Mika Sillanpää, Jari S. Penttilä, Mikko A. Paalanen, Pertti J. Hakonen

Research output: Contribution to journalArticlepeer-review

Abstract

We have measured IV-characteristics of a superconducting single-electron transistor (SET) whose island consists of SNS (Al-Cu-Al or Al-Cr-Al) structure with lengths 0.4, 0.15 and 0.4 μm, respectively. In samples with copper, a supercurrent as well as resonances are observed at small bias, and the samples behave like regular SSS SETs. The amplitude of Josephson-quasiparticle (JQP) peaks, however, displays strong variation with gate modulation, even though the Coulomb energy is small (island capacitance ∼1 fF). Chrome sections on the island result in a smooth, exponentially varying sub-gap current that can be modeled with the voltage fluctuation theory.

Original languageEnglish
Pages (from-to)1826-1827
Number of pages2
JournalPhysica B: Condensed Matter
Volume284-288
Issue numberPART II
DOIs
Publication statusPublished - 2000
Externally publishedYes

Keywords

  • JQP cycle
  • Johnson noise
  • Proximity effect
  • Single electron transistor

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering

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