TOF SIMS induced artificial topographical effects on the Y 2 (Al,Ga) 5 O 12 :Tb 3+ thin films deposited on Si substrates by the pulsed laser deposition technique

A. Yousif, R. M. Jafer, J. J. Terblans, O. M. Ntwaeaborwa, M. M. Duvenhage, Vinod Kumar, H. C. Swart

Research output: Contribution to journalArticlepeer-review

5 Citations (Scopus)

Abstract

The presence of various types of particles on the surface of the pulsed laser deposited (PLD) thin films as well as the differences in the film structure, played an important role to induce artificial topographical effects on Y 3 (Al,Ga) 5 O 12 :Tb 3+ PLD thin films deposited on Si substrates measured by time-of-flight secondary ion mass spectroscopy (TOF-SIMS). The two and three-dimensional (2D and 3D) images have been recorded in the positive ion mode. Analysis of the 3D images shows big agglomerated particles on the surface of the Si substrate that appears to be embedded in the substrate and the substrate appears to be on the same level as the particles. This phenomenon is due to the artificial topographic effects which are attributed to the experimental setup of the TOF-SIMS system.

Original languageEnglish
Pages (from-to)524-531
Number of pages8
JournalApplied Surface Science
Volume313
DOIs
Publication statusPublished - 15 Sept 2014
Externally publishedYes

Keywords

  • Agglomerated particles
  • TOF-SIMS
  • Topography

ASJC Scopus subject areas

  • General Chemistry
  • Condensed Matter Physics
  • General Physics and Astronomy
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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