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TOF SIMS analysis, structure and photoluminescence properties of pulsed laser deposited CaS:Eu2+ thin films
R. L. Nyenge, S. K.K. Shaat, L. L. Noto, P. P. Mokoena, H. C. Swart, O. M. Ntwaeaborwa
Research output: Contribution to journal › Article › peer-review
3
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(Scopus)