The use of power spectrum density for surface characterization of thin films
- Fredrick Madaraka Mwema
- , Esther Titilayo Akinlabi
- , Oluseyi Philip Oladijo
- University of Johannesburg
- Botswana International University of Science and Technology
Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review
45
Citations
(Scopus)