Material Science
X-Ray Diffraction
100%
Lamp
100%
Photoluminescence
100%
Annealing
100%
Diffraction Pattern
100%
Xenon
100%
Secondary Ion Mass Spectrometry
100%
X-Ray Photoelectron Spectroscopy
100%
Lanthanum
100%
Gadolinium
100%
Engineering
Ion Concentration
100%
Emission Peak
100%
Ray Photoelectron Spectroscopy
50%
Time-of-Flight
50%
Defects
50%
Color Coordinate
50%
X-Ray Diffraction Pattern
50%
Xenon Lamp
50%
Excitation Spectrum
50%
Broad Peak
50%
Keyphrases
Annealing
100%
Dy3+
100%
Nanophosphors
100%
Emission Peak
25%
Silica
12%
Structure-property Relationships
12%
Photoluminescence Properties
12%
Chemical Composition
12%
X-ray Photoelectron Spectroscopy
12%
Excitation Spectrum
12%
Lanthanum
12%
X-ray Diffraction Pattern
12%
Xenon Lamp
12%
Two-peak
12%
Broadband Emission
12%
Time-of-flight Secondary Ion Mass Spectrometry (ToF-SIMS)
12%
Gadolinium
12%
Oxyorthosilicates
12%
CIE Color Coordinates
12%
Self-trapped Excitons
12%
Self-trapped Exciton Emission
12%
Chemical State
12%
Defect Concentration
12%
Phase Transformation
12%
Physics
Exciton
100%
Ion Concentration
100%
Diffraction Pattern
50%
X Ray Spectroscopy
50%
Spectrometer
50%
X Ray Diffraction
50%
Photoluminescence
50%
Lanthanum
50%
Gadolinium
50%