Abstract
The location of the hydrogen prevalent in chemical vapor deposition (CVD) diamond has long been of much interest, not least because of the information it reveals about the H-driven growth mechanism. We have used micro-scanning elastic recoil detection analysis to map the hydrogen distribution in three dimensions in polycrystalline CVD diamond. The interface between two CVD layers, one grown with, and one grown without oxygen in the growth mixture has been studied for its hydrogen concentration. An upper limit on bulk hydrogen concentration has been determined. The possibility of hydrogen trapping in the bulk is also discussed.
Original language | English |
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Pages (from-to) | 1615-1619 |
Number of pages | 5 |
Journal | Diamond and Related Materials |
Volume | 8 |
Issue number | 8-9 |
DOIs | |
Publication status | Published - Aug 1999 |
Externally published | Yes |
Keywords
- CVD
- Diamond
- Elastic recoil detection
- Hydrogen
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- General Chemistry
- Mechanical Engineering
- Materials Chemistry
- Electrical and Electronic Engineering