Abstract
The compound CeRhSi2, crystallizing in the orthorhombic CeNiSi2-type structure, has been synthesized and studied by magnetic susceptibility and electrical resistivity between 1.7 and 300 K. The unit cell volume of CeRhSi2 shows a deviation from the lanthanide contraction. The temperature dependent magnetic susceptibility of CeRhSi2 exhibits a broad maximum at 80 K, which is characteristic of Ce based valence fluctuating compounds. The electric resistivity also shows a broad maximum at about 100 K, and exhibits a T2 dependence at low temperatures. These measurements confirm the valence fluctuating nature of CeRhSi2. An analysis is presented of the susceptibility data on the basis of the Coqblin-Schrieffer model, and of the resistivity data on the basis of the Freimuth model.
Original language | English |
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Pages (from-to) | 54-58 |
Number of pages | 5 |
Journal | Journal of Magnetism and Magnetic Materials |
Volume | 119 |
Issue number | 1-2 |
DOIs | |
Publication status | Published - 1 Feb 1993 |
Externally published | Yes |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics