Spectroscopic determination of crystal-field levels in CeRh 2Si 2 and CeRu 2Si 2 and of the 4f0 contributions in CeM 2Si 2 (M=Cu, Ru, Rh, Pd, and Au)

T. Willers; D. T. Adroja; B. D. Rainford; Z. Hu; N. Hollmann; P. O. Körner; Y. Y. Chin; D. Schmitz; H. H. Hsieh; H. J. Lin; C. T. Chen; E. D. Bauer; J. L. Sarrao; K. J. McClellan; D. Byler; C. Geibel; F. Steglich; H. Aoki; P. Lejay; A. Tanaka; L. H. Tjeng; A. Severing

doi:10.1103/PhysRevB.85.035117

Spectroscopic determination of crystal-field levels in CeRh ₂Si ₂ and CeRu ₂Si ₂ and of the 4f0 contributions in CeM ₂Si ₂ (M=Cu, Ru, Rh, Pd, and Au)

T. Willers
, D. T. Adroja
, B. D. Rainford
, Z. Hu
, N. Hollmann
, P. O. Körner
, Y. Y. Chin
, D. Schmitz
, H. H. Hsieh
, H. J. Lin
, C. T. Chen
, E. D. Bauer
, J. L. Sarrao
, K. J. McClellan
, D. Byler
, C. Geibel
, F. Steglich
, H. Aoki
, P. Lejay
, A. Tanaka

L. H. Tjeng, A. Severing

Research output: Contribution to journal › Article › peer-review

47 Citations (Scopus)

Abstract

We have determined the ground-state wave functions and crystal-field-level schemes of CeRh ₂Si ₂ and CeRu ₂Si ₂ using linear polarized soft x-ray-absorption spectroscopy (XAS) and inelastic neutron scattering. We find large crystal-field splittings and ground-state wave functions which are made of mainly J _z= |±5/2 with some amount of |3/2 in both the compounds. The 4f0 contribution to the ground state of several members of the CeM ₂Si ₂ family with M=(Cu, Ru, Rh, Pd, and Au) has been determined with XAS, and the comparison reveals a trend concerning the delocalization of the f electrons. Absolute numbers are extracted from scaling to results from hard x-ray photoelectron spectroscopy on CeRu ₂Si ₂ by Yano.

Original language	English
Article number	035117
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	85
Issue number	3
DOIs	https://doi.org/10.1103/PhysRevB.85.035117
Publication status	Published - 18 Jan 2012
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1103/PhysRevB.85.035117

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Willers, T., Adroja, D. T., Rainford, B. D., Hu, Z., Hollmann, N., Körner, P. O., Chin, Y. Y., Schmitz, D., Hsieh, H. H., Lin, H. J., Chen, C. T., Bauer, E. D., Sarrao, J. L., McClellan, K. J., Byler, D., Geibel, C., Steglich, F., Aoki, H., Lejay, P., ... Severing, A. (2012). Spectroscopic determination of crystal-field levels in CeRh ₂Si ₂ and CeRu ₂Si ₂ and of the 4f0 contributions in CeM ₂Si ₂ (M=Cu, Ru, Rh, Pd, and Au). Physical Review B - Condensed Matter and Materials Physics, 85(3), Article 035117. https://doi.org/10.1103/PhysRevB.85.035117

@article{e44fac1f4f9f4d0bbc79dac1490b90a8,

title = "Spectroscopic determination of crystal-field levels in CeRh 2Si 2 and CeRu 2Si 2 and of the 4f0 contributions in CeM 2Si 2 (M=Cu, Ru, Rh, Pd, and Au)",

abstract = "We have determined the ground-state wave functions and crystal-field-level schemes of CeRh 2Si 2 and CeRu 2Si 2 using linear polarized soft x-ray-absorption spectroscopy (XAS) and inelastic neutron scattering. We find large crystal-field splittings and ground-state wave functions which are made of mainly J z= |±5/2 with some amount of |3/2 in both the compounds. The 4f0 contribution to the ground state of several members of the CeM 2Si 2 family with M=(Cu, Ru, Rh, Pd, and Au) has been determined with XAS, and the comparison reveals a trend concerning the delocalization of the f electrons. Absolute numbers are extracted from scaling to results from hard x-ray photoelectron spectroscopy on CeRu 2Si 2 by Yano.",

author = "T. Willers and Adroja, \{D. T.\} and Rainford, \{B. D.\} and Z. Hu and N. Hollmann and K{\"o}rner, \{P. O.\} and Chin, \{Y. Y.\} and D. Schmitz and Hsieh, \{H. H.\} and Lin, \{H. J.\} and Chen, \{C. T.\} and Bauer, \{E. D.\} and Sarrao, \{J. L.\} and McClellan, \{K. J.\} and D. Byler and C. Geibel and F. Steglich and H. Aoki and P. Lejay and A. Tanaka and Tjeng, \{L. H.\} and A. Severing",

year = "2012",

month = jan,

day = "18",

doi = "10.1103/PhysRevB.85.035117",

language = "English",

volume = "85",

journal = "Physical Review B - Condensed Matter and Materials Physics",

issn = "1098-0121",

publisher = "American Physical Society",

number = "3",

}

Willers, T, Adroja, DT, Rainford, BD, Hu, Z, Hollmann, N, Körner, PO, Chin, YY, Schmitz, D, Hsieh, HH, Lin, HJ, Chen, CT, Bauer, ED, Sarrao, JL, McClellan, KJ, Byler, D, Geibel, C, Steglich, F, Aoki, H, Lejay, P, Tanaka, A, Tjeng, LH & Severing, A 2012, 'Spectroscopic determination of crystal-field levels in CeRh ₂Si ₂ and CeRu ₂Si ₂ and of the 4f0 contributions in CeM ₂Si ₂ (M=Cu, Ru, Rh, Pd, and Au)', Physical Review B - Condensed Matter and Materials Physics, vol. 85, no. 3, 035117. https://doi.org/10.1103/PhysRevB.85.035117

Spectroscopic determination of crystal-field levels in CeRh ₂Si ₂ and CeRu ₂Si ₂ and of the 4f0 contributions in CeM ₂Si ₂ (M=Cu, Ru, Rh, Pd, and Au). / Willers, T.; Adroja, D. T.; Rainford, B. D. et al.
In: Physical Review B - Condensed Matter and Materials Physics, Vol. 85, No. 3, 035117, 18.01.2012.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Spectroscopic determination of crystal-field levels in CeRh 2Si 2 and CeRu 2Si 2 and of the 4f0 contributions in CeM 2Si 2 (M=Cu, Ru, Rh, Pd, and Au)

AU - Willers, T.

AU - Adroja, D. T.

AU - Rainford, B. D.

AU - Hu, Z.

AU - Hollmann, N.

AU - Körner, P. O.

AU - Chin, Y. Y.

AU - Schmitz, D.

AU - Hsieh, H. H.

AU - Lin, H. J.

AU - Chen, C. T.

AU - Bauer, E. D.

AU - Sarrao, J. L.

AU - McClellan, K. J.

AU - Byler, D.

AU - Geibel, C.

AU - Steglich, F.

AU - Aoki, H.

AU - Lejay, P.

AU - Tanaka, A.

AU - Tjeng, L. H.

AU - Severing, A.

PY - 2012/1/18

Y1 - 2012/1/18

N2 - We have determined the ground-state wave functions and crystal-field-level schemes of CeRh 2Si 2 and CeRu 2Si 2 using linear polarized soft x-ray-absorption spectroscopy (XAS) and inelastic neutron scattering. We find large crystal-field splittings and ground-state wave functions which are made of mainly J z= |±5/2 with some amount of |3/2 in both the compounds. The 4f0 contribution to the ground state of several members of the CeM 2Si 2 family with M=(Cu, Ru, Rh, Pd, and Au) has been determined with XAS, and the comparison reveals a trend concerning the delocalization of the f electrons. Absolute numbers are extracted from scaling to results from hard x-ray photoelectron spectroscopy on CeRu 2Si 2 by Yano.

AB - We have determined the ground-state wave functions and crystal-field-level schemes of CeRh 2Si 2 and CeRu 2Si 2 using linear polarized soft x-ray-absorption spectroscopy (XAS) and inelastic neutron scattering. We find large crystal-field splittings and ground-state wave functions which are made of mainly J z= |±5/2 with some amount of |3/2 in both the compounds. The 4f0 contribution to the ground state of several members of the CeM 2Si 2 family with M=(Cu, Ru, Rh, Pd, and Au) has been determined with XAS, and the comparison reveals a trend concerning the delocalization of the f electrons. Absolute numbers are extracted from scaling to results from hard x-ray photoelectron spectroscopy on CeRu 2Si 2 by Yano.

UR - https://www.scopus.com/pages/publications/84863025461

U2 - 10.1103/PhysRevB.85.035117

DO - 10.1103/PhysRevB.85.035117

M3 - Article

AN - SCOPUS:84863025461

SN - 1098-0121

VL - 85

JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

IS - 3

M1 - 035117

ER -

Spectroscopic determination of crystal-field levels in CeRh ₂Si ₂ and CeRu ₂Si ₂ and of the 4f0 contributions in CeM ₂Si ₂ (M=Cu, Ru, Rh, Pd, and Au)

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