Spectroscopic determination of crystal-field levels in CeRh 2Si 2 and CeRu 2Si 2 and of the 4f0 contributions in CeM 2Si 2 (M=Cu, Ru, Rh, Pd, and Au)

T. Willers; D. T. Adroja; B. D. Rainford; Z. Hu; N. Hollmann; P. O. Körner; Y. Y. Chin; D. Schmitz; H. H. Hsieh; H. J. Lin; C. T. Chen; E. D. Bauer; J. L. Sarrao; K. J. McClellan; D. Byler; C. Geibel; F. Steglich; H. Aoki; P. Lejay; A. Tanaka; L. H. Tjeng; A. Severing

doi:10.1103/PhysRevB.85.035117

Spectroscopic determination of crystal-field levels in CeRh ₂Si ₂ and CeRu ₂Si ₂ and of the 4f0 contributions in CeM ₂Si ₂ (M=Cu, Ru, Rh, Pd, and Au)

T. Willers, D. T. Adroja, B. D. Rainford, Z. Hu, N. Hollmann, P. O. Körner, Y. Y. Chin, D. Schmitz, H. H. Hsieh, H. J. Lin, C. T. Chen, E. D. Bauer, J. L. Sarrao, K. J. McClellan, D. Byler, C. Geibel, F. Steglich, H. Aoki, P. Lejay, A. TanakaL. H. Tjeng, A. Severing

Research output: Contribution to journal › Article › peer-review

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Abstract

We have determined the ground-state wave functions and crystal-field-level schemes of CeRh ₂Si ₂ and CeRu ₂Si ₂ using linear polarized soft x-ray-absorption spectroscopy (XAS) and inelastic neutron scattering. We find large crystal-field splittings and ground-state wave functions which are made of mainly J _z= |±5/2 with some amount of |3/2 in both the compounds. The 4f0 contribution to the ground state of several members of the CeM ₂Si ₂ family with M=(Cu, Ru, Rh, Pd, and Au) has been determined with XAS, and the comparison reveals a trend concerning the delocalization of the f electrons. Absolute numbers are extracted from scaling to results from hard x-ray photoelectron spectroscopy on CeRu ₂Si ₂ by Yano.

Original language	English
Article number	035117
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	85
Issue number	3
DOIs	https://doi.org/10.1103/PhysRevB.85.035117
Publication status	Published - 18 Jan 2012
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1103/PhysRevB.85.035117

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Willers, T., Adroja, D. T., Rainford, B. D., Hu, Z., Hollmann, N., Körner, P. O., Chin, Y. Y., Schmitz, D., Hsieh, H. H., Lin, H. J., Chen, C. T., Bauer, E. D., Sarrao, J. L., McClellan, K. J., Byler, D., Geibel, C., Steglich, F., Aoki, H., Lejay, P., ... Severing, A. (2012). Spectroscopic determination of crystal-field levels in CeRh ₂Si ₂ and CeRu ₂Si ₂ and of the 4f0 contributions in CeM ₂Si ₂ (M=Cu, Ru, Rh, Pd, and Au). Physical Review B - Condensed Matter and Materials Physics, 85(3), Article 035117. https://doi.org/10.1103/PhysRevB.85.035117

@article{e44fac1f4f9f4d0bbc79dac1490b90a8,

title = "Spectroscopic determination of crystal-field levels in CeRh 2Si 2 and CeRu 2Si 2 and of the 4f0 contributions in CeM 2Si 2 (M=Cu, Ru, Rh, Pd, and Au)",

abstract = "We have determined the ground-state wave functions and crystal-field-level schemes of CeRh 2Si 2 and CeRu 2Si 2 using linear polarized soft x-ray-absorption spectroscopy (XAS) and inelastic neutron scattering. We find large crystal-field splittings and ground-state wave functions which are made of mainly J z= |±5/2 with some amount of |3/2 in both the compounds. The 4f0 contribution to the ground state of several members of the CeM 2Si 2 family with M=(Cu, Ru, Rh, Pd, and Au) has been determined with XAS, and the comparison reveals a trend concerning the delocalization of the f electrons. Absolute numbers are extracted from scaling to results from hard x-ray photoelectron spectroscopy on CeRu 2Si 2 by Yano.",

author = "T. Willers and Adroja, {D. T.} and Rainford, {B. D.} and Z. Hu and N. Hollmann and K{\"o}rner, {P. O.} and Chin, {Y. Y.} and D. Schmitz and Hsieh, {H. H.} and Lin, {H. J.} and Chen, {C. T.} and Bauer, {E. D.} and Sarrao, {J. L.} and McClellan, {K. J.} and D. Byler and C. Geibel and F. Steglich and H. Aoki and P. Lejay and A. Tanaka and Tjeng, {L. H.} and A. Severing",

year = "2012",

month = jan,

day = "18",

doi = "10.1103/PhysRevB.85.035117",

language = "English",

volume = "85",

journal = "Physical Review B - Condensed Matter and Materials Physics",

issn = "1098-0121",

publisher = "American Physical Society",

number = "3",

}

Willers, T, Adroja, DT, Rainford, BD, Hu, Z, Hollmann, N, Körner, PO, Chin, YY, Schmitz, D, Hsieh, HH, Lin, HJ, Chen, CT, Bauer, ED, Sarrao, JL, McClellan, KJ, Byler, D, Geibel, C, Steglich, F, Aoki, H, Lejay, P, Tanaka, A, Tjeng, LH & Severing, A 2012, 'Spectroscopic determination of crystal-field levels in CeRh ₂Si ₂ and CeRu ₂Si ₂ and of the 4f0 contributions in CeM ₂Si ₂ (M=Cu, Ru, Rh, Pd, and Au)', Physical Review B - Condensed Matter and Materials Physics, vol. 85, no. 3, 035117. https://doi.org/10.1103/PhysRevB.85.035117

Spectroscopic determination of crystal-field levels in CeRh ₂Si ₂ and CeRu ₂Si ₂ and of the 4f0 contributions in CeM ₂Si ₂ (M=Cu, Ru, Rh, Pd, and Au). / Willers, T.; Adroja, D. T.; Rainford, B. D. et al.
In: Physical Review B - Condensed Matter and Materials Physics, Vol. 85, No. 3, 035117, 18.01.2012.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Spectroscopic determination of crystal-field levels in CeRh 2Si 2 and CeRu 2Si 2 and of the 4f0 contributions in CeM 2Si 2 (M=Cu, Ru, Rh, Pd, and Au)

AU - Willers, T.

AU - Adroja, D. T.

AU - Rainford, B. D.

AU - Hu, Z.

AU - Hollmann, N.

AU - Körner, P. O.

AU - Chin, Y. Y.

AU - Schmitz, D.

AU - Hsieh, H. H.

AU - Lin, H. J.

AU - Chen, C. T.

AU - Bauer, E. D.

AU - Sarrao, J. L.

AU - McClellan, K. J.

AU - Byler, D.

AU - Geibel, C.

AU - Steglich, F.

AU - Aoki, H.

AU - Lejay, P.

AU - Tanaka, A.

AU - Tjeng, L. H.

AU - Severing, A.

PY - 2012/1/18

Y1 - 2012/1/18

N2 - We have determined the ground-state wave functions and crystal-field-level schemes of CeRh 2Si 2 and CeRu 2Si 2 using linear polarized soft x-ray-absorption spectroscopy (XAS) and inelastic neutron scattering. We find large crystal-field splittings and ground-state wave functions which are made of mainly J z= |±5/2 with some amount of |3/2 in both the compounds. The 4f0 contribution to the ground state of several members of the CeM 2Si 2 family with M=(Cu, Ru, Rh, Pd, and Au) has been determined with XAS, and the comparison reveals a trend concerning the delocalization of the f electrons. Absolute numbers are extracted from scaling to results from hard x-ray photoelectron spectroscopy on CeRu 2Si 2 by Yano.

AB - We have determined the ground-state wave functions and crystal-field-level schemes of CeRh 2Si 2 and CeRu 2Si 2 using linear polarized soft x-ray-absorption spectroscopy (XAS) and inelastic neutron scattering. We find large crystal-field splittings and ground-state wave functions which are made of mainly J z= |±5/2 with some amount of |3/2 in both the compounds. The 4f0 contribution to the ground state of several members of the CeM 2Si 2 family with M=(Cu, Ru, Rh, Pd, and Au) has been determined with XAS, and the comparison reveals a trend concerning the delocalization of the f electrons. Absolute numbers are extracted from scaling to results from hard x-ray photoelectron spectroscopy on CeRu 2Si 2 by Yano.

UR - http://www.scopus.com/inward/record.url?scp=84863025461&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.85.035117

DO - 10.1103/PhysRevB.85.035117

M3 - Article

AN - SCOPUS:84863025461

SN - 1098-0121

VL - 85

JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

IS - 3

M1 - 035117

ER -

Spectroscopic determination of crystal-field levels in CeRh ₂Si ₂ and CeRu ₂Si ₂ and of the 4f0 contributions in CeM ₂Si ₂ (M=Cu, Ru, Rh, Pd, and Au)

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