Slow positron beam study of natural and synthetic diamonds

C. G. Fischer; S. H. Connell; P. G. Coleman; F. Malik; D. T. Britton; J. P.F. Sellschop

doi:10.1016/S0169-4332(99)00205-6

Slow positron beam study of natural and synthetic diamonds

C. G. Fischer, S. H. Connell, P. G. Coleman, F. Malik, D. T. Britton, J. P.F. Sellschop

Research output: Contribution to journal › Conference article › peer-review

7 Citations (Scopus)

Abstract

We have depth profiled single crystalline natural type IIA, type IIB and synthetic type IB diamonds with a slow positron beam using Doppler broadening spectroscopy. It was found that the data for all three samples, which differ with respect to defect type and content, could be well described using only a surface and a homogenous bulk component. The bulk positron diffusion lengths measured for these samples were found to be sensitive to the differing defect composition of the samples.

Original language	English
Pages (from-to)	221-226
Number of pages	6
Journal	Applied Surface Science
Volume	149
Issue number	1
DOIs	https://doi.org/10.1016/S0169-4332(99)00205-6
Publication status	Published - 1 Aug 1999
Externally published	Yes
Event	Proceeding of the 1998 8th International Workshop on Slow-Positron Beam Techniques fot Solids and Surfaces - Cape Town, S Afr Duration: 6 Sept 1998 → 12 Sept 1998

ASJC Scopus subject areas

General Chemistry
Condensed Matter Physics
General Physics and Astronomy
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/S0169-4332(99)00205-6

Cite this

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title = "Slow positron beam study of natural and synthetic diamonds",

abstract = "We have depth profiled single crystalline natural type IIA, type IIB and synthetic type IB diamonds with a slow positron beam using Doppler broadening spectroscopy. It was found that the data for all three samples, which differ with respect to defect type and content, could be well described using only a surface and a homogenous bulk component. The bulk positron diffusion lengths measured for these samples were found to be sensitive to the differing defect composition of the samples.",

author = "Fischer, {C. G.} and Connell, {S. H.} and Coleman, {P. G.} and F. Malik and Britton, {D. T.} and Sellschop, {J. P.F.}",

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TY - JOUR

T1 - Slow positron beam study of natural and synthetic diamonds

AU - Fischer, C. G.

AU - Connell, S. H.

AU - Coleman, P. G.

AU - Malik, F.

AU - Britton, D. T.

AU - Sellschop, J. P.F.

PY - 1999/8/1

Y1 - 1999/8/1

N2 - We have depth profiled single crystalline natural type IIA, type IIB and synthetic type IB diamonds with a slow positron beam using Doppler broadening spectroscopy. It was found that the data for all three samples, which differ with respect to defect type and content, could be well described using only a surface and a homogenous bulk component. The bulk positron diffusion lengths measured for these samples were found to be sensitive to the differing defect composition of the samples.

AB - We have depth profiled single crystalline natural type IIA, type IIB and synthetic type IB diamonds with a slow positron beam using Doppler broadening spectroscopy. It was found that the data for all three samples, which differ with respect to defect type and content, could be well described using only a surface and a homogenous bulk component. The bulk positron diffusion lengths measured for these samples were found to be sensitive to the differing defect composition of the samples.

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U2 - 10.1016/S0169-4332(99)00205-6

DO - 10.1016/S0169-4332(99)00205-6

M3 - Conference article

AN - SCOPUS:0032642748

SN - 0169-4332

VL - 149

SP - 221

EP - 226

JO - Applied Surface Science

JF - Applied Surface Science

IS - 1

T2 - Proceeding of the 1998 8th International Workshop on Slow-Positron Beam Techniques fot Solids and Surfaces

Y2 - 6 September 1998 through 12 September 1998

ER -

Slow positron beam study of natural and synthetic diamonds

Abstract

ASJC Scopus subject areas

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