Rocking curve measurements revisited

Fabio Masiello; Gianfranco Cembali; Alexander I. Chumakov; Simon H. Connell; Claudio Ferrero; Jürgen Härtwig; Ilya Sergeev; Pierre Van Vaerenbergh

doi:10.1107/S1600576714012527

Rocking curve measurements revisited

Fabio Masiello, Gianfranco Cembali, Alexander I. Chumakov, Simon H. Connell, Claudio Ferrero, Jürgen Härtwig, Ilya Sergeev, Pierre Van Vaerenbergh

Physics

Research output: Contribution to journal › Article › peer-review

16 Citations (Scopus)

Abstract

In order to correctly analyse high-resolution rocking curves of high-quality crystals, a special effort is needed to estimate the systematic contributions coming from the experimental setup. This article highlights the main areas that require special analytical treatment and presents results obtained using different approaches to the problem, as well as some typical results for high-quality silicon and diamond crystals.

Original language	English
Pages (from-to)	1304-1314
Number of pages	11
Journal	Journal of Applied Crystallography
Volume	47
Issue number	4
DOIs	https://doi.org/10.1107/S1600576714012527
Publication status	Published - Aug 2014

Keywords

X-ray diffraction
rocking curves

ASJC Scopus subject areas

General Biochemistry,Genetics and Molecular Biology

Access to Document

10.1107/S1600576714012527

Cite this

@article{22516363171344539d4ee657f67e2b5a,

title = "Rocking curve measurements revisited",

abstract = "In order to correctly analyse high-resolution rocking curves of high-quality crystals, a special effort is needed to estimate the systematic contributions coming from the experimental setup. This article highlights the main areas that require special analytical treatment and presents results obtained using different approaches to the problem, as well as some typical results for high-quality silicon and diamond crystals.",

keywords = "X-ray diffraction, rocking curves",

author = "Fabio Masiello and Gianfranco Cembali and Chumakov, {Alexander I.} and Connell, {Simon H.} and Claudio Ferrero and J{\"u}rgen H{\"a}rtwig and Ilya Sergeev and {Van Vaerenbergh}, Pierre",

year = "2014",

month = aug,

doi = "10.1107/S1600576714012527",

language = "English",

volume = "47",

pages = "1304--1314",

journal = "Journal of Applied Crystallography",

issn = "0021-8898",

publisher = "International Union of Crystallography",

number = "4",

}

TY - JOUR

T1 - Rocking curve measurements revisited

AU - Masiello, Fabio

AU - Cembali, Gianfranco

AU - Chumakov, Alexander I.

AU - Connell, Simon H.

AU - Ferrero, Claudio

AU - Härtwig, Jürgen

AU - Sergeev, Ilya

AU - Van Vaerenbergh, Pierre

PY - 2014/8

Y1 - 2014/8

N2 - In order to correctly analyse high-resolution rocking curves of high-quality crystals, a special effort is needed to estimate the systematic contributions coming from the experimental setup. This article highlights the main areas that require special analytical treatment and presents results obtained using different approaches to the problem, as well as some typical results for high-quality silicon and diamond crystals.

AB - In order to correctly analyse high-resolution rocking curves of high-quality crystals, a special effort is needed to estimate the systematic contributions coming from the experimental setup. This article highlights the main areas that require special analytical treatment and presents results obtained using different approaches to the problem, as well as some typical results for high-quality silicon and diamond crystals.

KW - X-ray diffraction

KW - rocking curves

UR - http://www.scopus.com/inward/record.url?scp=84905457470&partnerID=8YFLogxK

U2 - 10.1107/S1600576714012527

DO - 10.1107/S1600576714012527

M3 - Article

AN - SCOPUS:84905457470

SN - 0021-8898

VL - 47

SP - 1304

EP - 1314

JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

IS - 4

ER -

Rocking curve measurements revisited

Abstract

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this