Retraction notice to ‘Influence of sputtering parameters on the structural and mechanical properties of TiC thin film coating’. [Appl. Surf. Sci. 520 (2020) 146323](S0169433220310801)(10.1016/j.apsusc.2020.146323)

Olayinka Oluwatosin Abegunde; Esther Titilayo Akinlabi; Oluseyi Philip Oladijo

doi:10.1016/j.apsusc.2022.152467

Retraction notice to ‘Influence of sputtering parameters on the structural and mechanical properties of TiC thin film coating’. [Appl. Surf. Sci. 520 (2020) 146323](S0169433220310801)(10.1016/j.apsusc.2020.146323)

Olayinka Oluwatosin Abegunde, Esther Titilayo Akinlabi, Oluseyi Philip Oladijo

Mechanical Engineering Science

Research output: Contribution to journal › Comment/debate

1 Citation (Scopus)

Abstract

This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the Editor in Chief due to very significant similarity between it and another published article by the same author (“Dataset on microstructural, structural and tribology characterization of TiC thin film on CpTi substrate grown by RF magnetron sputtering”, by Olayinka Oluwatosin Abegunde, Esther Titilayo Akinlabi, Philip Oluseyi Oladijo, Data in Brief, Vol 29, 105205, January 2020 https://doi.org/10.1016/j.dib.2020.105205) and the clear duplication of figures and tables.

Original language	English
Article number	152467
Journal	Applied Surface Science
Volume	585
DOIs	https://doi.org/10.1016/j.apsusc.2022.152467
Publication status	Published - 30 May 2022

ASJC Scopus subject areas

General Chemistry
Condensed Matter Physics
General Physics and Astronomy
Surfaces and Interfaces
Surfaces, Coatings and Films

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title = "Retraction notice to {\textquoteleft}Influence of sputtering parameters on the structural and mechanical properties of TiC thin film coating{\textquoteright}. [Appl. Surf. Sci. 520 (2020) 146323](S0169433220310801)(10.1016/j.apsusc.2020.146323)",

abstract = "This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the Editor in Chief due to very significant similarity between it and another published article by the same author (“Dataset on microstructural, structural and tribology characterization of TiC thin film on CpTi substrate grown by RF magnetron sputtering”, by Olayinka Oluwatosin Abegunde, Esther Titilayo Akinlabi, Philip Oluseyi Oladijo, Data in Brief, Vol 29, 105205, January 2020 https://doi.org/10.1016/j.dib.2020.105205) and the clear duplication of figures and tables.",

author = "Abegunde, {Olayinka Oluwatosin} and Akinlabi, {Esther Titilayo} and Oladijo, {Oluseyi Philip}",

note = "Publisher Copyright: {\textcopyright} 2020 Elsevier B.V.",

year = "2022",

month = may,

day = "30",

doi = "10.1016/j.apsusc.2022.152467",

language = "English",

volume = "585",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier",

}

Retraction notice to ‘Influence of sputtering parameters on the structural and mechanical properties of TiC thin film coating’. [Appl. Surf. Sci. 520 (2020) 146323](S0169433220310801)(10.1016/j.apsusc.2020.146323). / Abegunde, Olayinka Oluwatosin; Akinlabi, Esther Titilayo; Oladijo, Oluseyi Philip.
In: Applied Surface Science, Vol. 585, 152467, 30.05.2022.

Research output: Contribution to journal › Comment/debate

TY - JOUR

T1 - Retraction notice to ‘Influence of sputtering parameters on the structural and mechanical properties of TiC thin film coating’. [Appl. Surf. Sci. 520 (2020) 146323](S0169433220310801)(10.1016/j.apsusc.2020.146323)

AU - Abegunde, Olayinka Oluwatosin

AU - Akinlabi, Esther Titilayo

AU - Oladijo, Oluseyi Philip

PY - 2022/5/30

Y1 - 2022/5/30

N2 - This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the Editor in Chief due to very significant similarity between it and another published article by the same author (“Dataset on microstructural, structural and tribology characterization of TiC thin film on CpTi substrate grown by RF magnetron sputtering”, by Olayinka Oluwatosin Abegunde, Esther Titilayo Akinlabi, Philip Oluseyi Oladijo, Data in Brief, Vol 29, 105205, January 2020 https://doi.org/10.1016/j.dib.2020.105205) and the clear duplication of figures and tables.

AB - This article has been retracted: please see Elsevier Policy on Article Withdrawal (https://www.elsevier.com/about/our-business/policies/article-withdrawal). This article has been retracted at the request of the Editor in Chief due to very significant similarity between it and another published article by the same author (“Dataset on microstructural, structural and tribology characterization of TiC thin film on CpTi substrate grown by RF magnetron sputtering”, by Olayinka Oluwatosin Abegunde, Esther Titilayo Akinlabi, Philip Oluseyi Oladijo, Data in Brief, Vol 29, 105205, January 2020 https://doi.org/10.1016/j.dib.2020.105205) and the clear duplication of figures and tables.

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U2 - 10.1016/j.apsusc.2022.152467

DO - 10.1016/j.apsusc.2022.152467

M3 - Comment/debate

AN - SCOPUS:85123919497

SN - 0169-4332

VL - 585

JO - Applied Surface Science

JF - Applied Surface Science

M1 - 152467

ER -

Retraction notice to ‘Influence of sputtering parameters on the structural and mechanical properties of TiC thin film coating’. [Appl. Surf. Sci. 520 (2020) 146323](S0169433220310801)(10.1016/j.apsusc.2020.146323)

Abstract

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