Abstract
The time differential perturbed angular distribution (TDPAD) technique as applied to semi-conductors and insulators has a unique place among the other analytical methods involving ion beams. It provides an opportunity to study molecular complex-like systems involving the radioactive probe, and also in-situ hot atom chemistry. Both of these aspects are important in understanding dopant-impurity dynamics, particularly in the context of ion-implantation. The very recent advances in the synthetic growth and the defect engineering of diamond have ensured it will be no exception. 19F TDPAD data for various natural and synthetic diamonds, as well as for some polymer systems, is reviewed in this context, and confirm that 19F TDPAD could become an extremely sensitive probe of the important but elusive impurity, hydrogen.
Original language | English |
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Pages (from-to) | 508-515 |
Number of pages | 8 |
Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 85 |
Issue number | 1-4 |
DOIs | |
Publication status | Published - 2 Mar 1994 |
Externally published | Yes |
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Instrumentation