Parasitic capacitances in double gate MOSFET

Viranjay M. Srivastava, Priyank, Sharad P. Singh, G. Singh

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

Parasitic components of a MOSFET are mainly responsible for the intrinsic delay of logic gates, and they can be modelled with fairly high accuracy for gate delay estimation. The extraction of transistor parasitic from physical structure (mask layout) is also fairly straightforward. The first component of capacitive parasitic, we will examine is the MOSFET capacitances. The classical approach for determining the switching speed of the logic gates is based on the assumption that the loads are mainly capacitive and lumped. Relatively simple delay models exist for logic gates with purely capacitive load at the output node; hence the dynamic behaviour of the circuit can be estimated easily once the load is determined.

Original languageEnglish
Title of host publicationITC 2010 - 2010 International Conference on Recent Trends in Information, Telecommunication, and Computing
Pages305-307
Number of pages3
DOIs
Publication statusPublished - 2010
Externally publishedYes
EventInternational Conference on Recent Trends in Information, Telecommunication, and Computing, ITC 2010 - Kochi, Kerala, India
Duration: 12 Mar 201013 Mar 2010

Publication series

NameITC 2010 - 2010 International Conference on Recent Trends in Information, Telecommunication, and Computing

Conference

ConferenceInternational Conference on Recent Trends in Information, Telecommunication, and Computing, ITC 2010
Country/TerritoryIndia
CityKochi, Kerala
Period12/03/1013/03/10

Keywords

  • Double gate mosfet
  • Interconnects
  • Parasitic capacitances
  • VLSI

ASJC Scopus subject areas

  • Computational Theory and Mathematics
  • Computer Networks and Communications
  • Software

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