New development of atomic layer deposition: processes, methods and applications

Peter Ozaveshe Oviroh, Rokhsareh Akbarzadeh, Dongqing Pan, Rigardt Alfred Maarten Coetzee, Tien Chien Jen

Research output: Contribution to journalReview articlepeer-review

346 Citations (Scopus)

Abstract

Atomic layer deposition (ALD) is an ultra-thin film deposition technique that has found many applications owing to its distinct abilities. They include uniform deposition of conformal films with controllable thickness, even on complex three-dimensional surfaces, and can improve the efficiency of electronic devices. This technology has attracted significant interest both for fundamental understanding how the new functional materials can be synthesized by ALD and for numerous practical applications, particularly in advanced nanopatterning for microelectronics, energy storage systems, desalinations, catalysis and medical fields. This review introduces the progress made in ALD, both for computational and experimental methodologies, and provides an outlook of this emerging technology in comparison with other film deposition methods. It discusses experimental approaches and factors that affect the deposition and presents simulation methods, such as molecular dynamics and computational fluid dynamics, which help determine and predict effective ways to optimize ALD processes, hence enabling the reduction in cost, energy waste and adverse environmental impacts. Specific examples are chosen to illustrate the progress in ALD processes and applications that showed a considerable impact on other technologies.

Original languageEnglish
Pages (from-to)465-496
Number of pages32
JournalScience and Technology of Advanced Materials
Volume20
Issue number1
DOIs
Publication statusPublished - 31 Dec 2019

Keywords

  • 10 Engineering and Structural materials
  • 102 Porous / Nanoporous / Nanostructured materials
  • 306 Thin film / Coatings
  • 400 Modeling / Simulations
  • Atomic layer deposition
  • Computational fluid dynamics
  • Molecular dynamics
  • Thin film

ASJC Scopus subject areas

  • General Materials Science

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