Neural Topic Generation Utilizing Attention Mechanisms With Transformer-Based Embeddings for Root-Cause Analysis of Manufacturing Defects in Electronic Products
- Vutivi Mabasa
- , Uche A.K. Chude-Okonkwo
- , Babu S. Paul
- University of Johannesburg
Research output: Contribution to journal › Article › peer-review
1
Citation
(Scopus)