TY - GEN
T1 - Negative Capacitance Analysis of a Statistically Significant Sample of Discrete Diodes
AU - Venter, Johan
N1 - Publisher Copyright:
© 2024 IEEE.
PY - 2024
Y1 - 2024
N2 - In this work, capacitance analysis of a statistically significant sample of 30 diodes were conducted for a wide voltage range. For voltages below the built-in bulk potential, a well-known mathematical model exists. This work mainly focusses on potentials above the built-in bulk potential which is not widely understood. This was done using a direct measurement method, through the use of a Capacitance Voltage meter. The results show that at higher biasing voltages and higher oscillating frequencies, these discrete diodes from the same batch exhibit negative capacitance. This work provides insight into the possibility of implementing a negative capacitance in circuits under certain conditions to lower the overall capacitance, which can have a significant effect on many circuit types (light current and heavy current circuits).
AB - In this work, capacitance analysis of a statistically significant sample of 30 diodes were conducted for a wide voltage range. For voltages below the built-in bulk potential, a well-known mathematical model exists. This work mainly focusses on potentials above the built-in bulk potential which is not widely understood. This was done using a direct measurement method, through the use of a Capacitance Voltage meter. The results show that at higher biasing voltages and higher oscillating frequencies, these discrete diodes from the same batch exhibit negative capacitance. This work provides insight into the possibility of implementing a negative capacitance in circuits under certain conditions to lower the overall capacitance, which can have a significant effect on many circuit types (light current and heavy current circuits).
KW - capacitance-voltage characteristics
KW - diodes
KW - semiconductor devices
UR - http://www.scopus.com/inward/record.url?scp=85207854239&partnerID=8YFLogxK
U2 - 10.1109/AE61743.2024.10710189
DO - 10.1109/AE61743.2024.10710189
M3 - Conference contribution
AN - SCOPUS:85207854239
T3 - International Conference on Applied Electronics
BT - 29th 2024 International Conference on Applied Electronics, AE 2024
A2 - Pinker, Jiff
PB - IEEE Computer Society
T2 - 29th International Conference on Applied Electronics, AE 2024
Y2 - 4 September 2024
ER -