Nanotechnology characterization: Emerging techniques for accurate and reliable nanostructural analysis

Nanomaterial characterization is at the heart of advancing materials science and nanotechnology, enabling the design of innovative materials and devices with superior properties. This chapter offers a comprehensive exploration of prominent nanomaterial characterization techniques, such as atomic force microscopy, X-ray diffraction, scanning electron microscopy, transmission electron microscopy, X-ray photoelectron spectroscopy, dynamic light scattering, ultraviolet-visible spectroscopy, and Fourier transform infrared spectroscopy. It delves into their principles, methodologies, and applications, emphasizing the challenges posed by the nanoscale and the need for specialized tools. This chapter underscores the synergy between these methods, demonstrating that their combined use leads to more accurate and detailed characterizations, overcoming limitations and leveraging complementary information. A distinguishing feature of this work is its extensive analysis of the challenges in nanomaterial characterization. It highlights the limitations of traditional techniques at the nanoscale, showcasing the significance of minimizing artifacts introduced during sample preparation. This study emphasizes the need for specialized tools and methodologies to obtain quantitative measurements and understand the relationships between structure, composition, and performance at the nanoscale. To address these challenges, the chapter discusses innovative solutions, including advancements in instrumentation, sample preparation, and data analysis. It illustrates how researchers are pushing the boundaries of each technique to provide more accurate and reliable data. Lastly, this study provides a forward-looking perspective on the future of nanomaterial characterization.