Molecular marker technology linked to pest and pathogen resistance in wheat breeding

A. M. Botha, E. Venter

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)


Considerable advances in DNA marker technology in recent years have led to an increased understanding of the complexity of the wheat genome as well as the mapping of a large number of genes of interest. In the process, 60 loci linked to disease and pest resistance have been mapped using different marker applications. Although restriction fragment length polymorphism markers have been the basis for most of this work, useful markers have also been obtained using random amplified polymorphic DNA, sequence characterized amplified regions, amplified fragment length polymorphisms and, most recently, simple sequence repeats. The next challenge facing breeders is the application of these markers in breeding programmes.

Original languageEnglish
Pages (from-to)233-240
Number of pages8
JournalSouth African Journal of Science
Issue number5
Publication statusPublished - 2000
Externally publishedYes

ASJC Scopus subject areas

  • General Biochemistry,Genetics and Molecular Biology
  • General Agricultural and Biological Sciences
  • General Earth and Planetary Sciences


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