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Micromorphology of sputtered aluminum thin films: A fractal analysis
F. M. Mwema
,
E. T. Akinlabi
, O. P. Oladijo
University of Johannesburg
Botswana International University of Science and Technology
Research output
:
Contribution to journal
›
Conference article
›
peer-review
6
Citations (Scopus)
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Keyphrases
Al Thin Film
33%
Aluminium Structures
33%
Aluminum Film
33%
Aluminum Thin Film
100%
Atomic Force Microscope
33%
Elastic Modulus
33%
Field Emission Scanning Electron Microscopy (FE-SEM)
33%
Fractal Analysis
100%
Fractal Dimension
33%
Fractality
33%
Globular
33%
High Substrate Temperature
33%
Interface Width
33%
Low Substrate Temperature
33%
Magnetron Sputtering Method
33%
Maximum Depth
33%
Mechanical Behavior
33%
Mechanical Properties
33%
Micromorphology
100%
Microscope Method
33%
Microstructure
33%
Microstructure Behavior
33%
Microstructure Properties
33%
Monofractal
33%
Nanoindentation
33%
Nanoindentation Technique
33%
Power Frequency
66%
Radio Frequency Magnetron Sputtering
33%
Substrate Temperature
100%
Surface Analysis
33%
Surface Microstructure
33%
Material Science
Aluminum
100%
Elastic Moduli
25%
Film
100%
Magnetron Sputtering
25%
Mechanical Property
50%
Nanoindentation
50%
Scanning Electron Microscopy
25%
Surface Analysis
25%
Thin Films
100%