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Micromorphology of sputtered aluminum thin films: A fractal analysis
F. M. Mwema
,
E. T. Akinlabi
, O. P. Oladijo
University of Johannesburg
Botswana International University of Science and Technology
Research output
:
Contribution to journal
›
Conference article
›
peer-review
6
Citations (Scopus)
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Engineering
Substrate Temperature
100%
Thin Films
100%
Microstructure
80%
Radio Frequency
60%
Deposited Film
20%
Atomic Force Microscope
20%
Young's Modulus
20%
Fractal Dimension
20%
Field Emission Scanning Electron Microscope
20%
Aluminum Structure
20%
Aluminum Film
20%
Magnetron
20%
Material Science
Film
100%
Aluminum
100%
Thin Films
100%
Nanoindentation
50%
Scanning Electron Microscopy
25%
Surface Analysis
25%
Magnetron Sputtering
25%
Elastic Moduli
25%
Mechanical Property
25%
Keyphrases
Low Substrate Temperature
50%
Nanoindentation Technique
50%
Maximum Depth
50%