@inproceedings{eaf30e1562fa411f99520d075e97a7ea,
title = "Life Modelling of Metal-Oxide Surge Arresters: A Comparison of Computational Techniques for Analysing Failure Data",
abstract = "This study investigates the accuracy of two computational techniques in modelling metal-oxide varistor surge arrester failure data. The maximum likelihood estimation technique is compared with the recommended method for analysing electrical insulation breakdown data-i.e. a modified rank method with regression. Failure data used for the study are obtained experimentally through conducting accelerated degradation tests of metal-oxide varistor samples, with and without continuously applied distorted voltage stress. The failure probability distributions of the device, under these different stress conditions, are modelled using each of the computational techniques. Results indicate that while the recommended method does provide a reasonably adequate estimate of these distributions, the resulting mean square error is significantly larger than that obtained when using the maximum likelihood technique.",
keywords = "Metal-oxide surge arrester, distorted voltage stress, failure data, maximum likelihood",
author = "Wesley Doorsamy and Pitshou Bokoro",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 2018 IEEE International Conference on Environment and Electrical Engineering and 2018 IEEE Industrial and Commercial Power Systems Europe, EEEIC/I and CPS Europe 2018 ; Conference date: 12-06-2018 Through 15-06-2018",
year = "2018",
month = oct,
day = "16",
doi = "10.1109/EEEIC.2018.8493790",
language = "English",
series = "Proceedings - 2018 IEEE International Conference on Environment and Electrical Engineering and 2018 IEEE Industrial and Commercial Power Systems Europe, EEEIC/I and CPS Europe 2018",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "Proceedings - 2018 IEEE International Conference on Environment and Electrical Engineering and 2018 IEEE Industrial and Commercial Power Systems Europe, EEEIC/I and CPS Europe 2018",
address = "United States",
}