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Ion beam induced defects in solids studied by optical techniques
J. D. Comins
, G. O. Amolo
, T. E. Derry
,
S. H. Connell
, R. M. Erasmus
, M. J. Witcomb
University of the Witwatersrand
Research output
:
Contribution to journal
›
Article
›
peer-review
4
Citations (Scopus)
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Keyphrases
Optical Absorption Studies
100%
Y-cut
100%
Defects in Solids
100%
LiNbO3 Crystal
50%
Mie Theory
50%
Ion Beam Irradiation
50%
Extinction Curves
50%
Alkali Halides
50%
Radiation Hardness
50%
Ion Beam Interaction
50%
Depth Profiling
50%
Indium Oxide Thin Films
50%
Proton Bombardment
50%
Optical Extinction
50%
Surface Facet
50%
Raman Light Scattering
50%
Defect Clusters
50%
Large Temperature Difference
50%
Defect Growth
50%
F-center
50%
Brillouin Light Scattering
50%
CsI Crystal
50%
Argon Ions
50%
Physics
Ion Beams
100%
Fluence
100%
Nanoparticle
75%
Electromagnetic Absorption
50%
Gold Nanoparticle
25%
Beam Interaction
25%
Crystal Structure
25%
X Ray Diffraction
25%
Amorphous Silicon
25%
Oxide Film
25%
Light Scattering
25%
Mie Scattering
25%
Indium Oxides
25%
Flat Surface
25%
Optical Method
25%
Engineering
Induced Defect
100%
Defects
100%
Nanoparticle
75%
Crystal Structure
25%
Ray Diffraction
25%
Bombardment
25%
Brillouin Zone
25%
Gold Nanoparticle
25%
Silicon Layer
25%
Spectral Region
25%
Anisotropic Diffusion
25%
Oxide Film
25%
Beam Irradiation
25%
Crystalline Silicon
25%
Mie Theory
25%
Material Science
Annealing
100%
Nanoparticle
100%
Crystalline Material
33%
X-Ray Diffraction
33%
Crystal Structure
33%
Oxide Film
33%
Silicon
33%
Gold Nanoparticle
33%
Tin
33%
Halide
33%
Indium
33%
Amorphous Silicon
33%