TY - GEN
T1 - Improving the diagnosis of incipient faults in power transformers using dissolved gas analysis and multi layer perceptron
AU - Nkosi, S.
AU - Bokoro, P.
N1 - Publisher Copyright:
© 2019 IEEE.
PY - 2019/6
Y1 - 2019/6
N2 - In this work, a ten year gas production records, obtained from Rodgers ratio codes for gas concentration of H2, CH4, C2H6, C2H4 and C2H2, in a 795 MVA 20/400 kV rated power transformer are used in MLP for improving the diagnosis accuracy of incipient faults (partial discharge, thermal faults, low and high energy discharges, etc...). Numerical modelling of DGA-sourced data was achieved using MATLAB platform. Performance validation for the neural network was assessed in terms of the regression fit (R), the MSE and the MAPE. Results show 2.51 % as optimal value of MAPE which indicate a reasonable accuracy of ANN technique in the prediction of incipient faults.
AB - In this work, a ten year gas production records, obtained from Rodgers ratio codes for gas concentration of H2, CH4, C2H6, C2H4 and C2H2, in a 795 MVA 20/400 kV rated power transformer are used in MLP for improving the diagnosis accuracy of incipient faults (partial discharge, thermal faults, low and high energy discharges, etc...). Numerical modelling of DGA-sourced data was achieved using MATLAB platform. Performance validation for the neural network was assessed in terms of the regression fit (R), the MSE and the MAPE. Results show 2.51 % as optimal value of MAPE which indicate a reasonable accuracy of ANN technique in the prediction of incipient faults.
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UR - http://www.scopus.com/inward/record.url?scp=85070613947&partnerID=8YFLogxK
U2 - 10.1109/ISIE.2019.8781242
DO - 10.1109/ISIE.2019.8781242
M3 - Conference contribution
AN - SCOPUS:85070613947
T3 - IEEE International Symposium on Industrial Electronics
SP - 112
EP - 117
BT - Proceedings - 2019 IEEE 28th International Symposium on Industrial Electronics, ISIE 2019
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 28th IEEE International Symposium on Industrial Electronics, ISIE 2019
Y2 - 12 June 2019 through 14 June 2019
ER -