Improved BER analysis of OFDM communication system on correlated Nakagami-m fading channel

Vivek K. Dwivedi, G. Singh

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Citations (Scopus)

Abstract

In this paper, performance of OFDM digital communication systems have been analyzed over correlated Nakagami-m fading channel using maximal ratio combining (MRC) diversity at the receiver. We have studied statistical characteristics of inter-carrier-interference over correlated Nakagami-m fading channel and also presented signal to interference noise ratio (SINR) over correlated Nakagami-m fading channels. We also derived a novel mathematical expression of bit error rate (BER) for QPSK/QFSK OFDM systems.

Original languageEnglish
Title of host publication2008 International Conference of Recents Advances in Microwave Theory and Applications, MICROWAVE 2008
Pages536-539
Number of pages4
DOIs
Publication statusPublished - 2008
Externally publishedYes
Event2008 International Conference of Recent Advances in Microwave Theory and Applications, MICROWAVE 2008 - Jaipur, Rajasthan, India
Duration: 21 Nov 200824 Nov 2008

Publication series

Name2008 International Conference of Recent Advances in Microwave Theory and Applications, MICROWAVE 2008

Conference

Conference2008 International Conference of Recent Advances in Microwave Theory and Applications, MICROWAVE 2008
Country/TerritoryIndia
CityJaipur, Rajasthan
Period21/11/0824/11/08

Keywords

  • Bit error rate
  • Fading channels
  • ICI
  • MRC
  • Multi-carrier
  • OFDM

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

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