High-resolution soft X-ray photoemission study of a Kondo semiconductor and related compounds

A. Sekiyama; Y. Fujita; M. Tsunekawa; S. Kasai; A. Shigemoto; S. Imada; D. T. Adroja; T. Yoshino; F. Iga; T. Takabatake; T. Nanba; S. Suga

doi:10.1016/j.elspec.2005.01.099

High-resolution soft X-ray photoemission study of a Kondo semiconductor and related compounds

A. Sekiyama, Y. Fujita, M. Tsunekawa, S. Kasai, A. Shigemoto, S. Imada, D. T. Adroja, T. Yoshino, F. Iga, T. Takabatake, T. Nanba, S. Suga

Research output: Contribution to journal › Article › peer-review

6 Citations (Scopus)

Abstract

We have performed the bulk-sensitive high-resolution soft X-ray photoemission study of a Kondo semiconductor CeRhAs and related compounds CeNiSn and CePdSn. The comparison of the spectra of polycrystalline CePdSn on the fractured and scraped surfaces show that the fracturing of the samples is much better than the scraping in order to obtain intrinsic photoemission spectra. The Ce 4d core-level spectra show clear differences in the electronic states among the materials.

Original language	English
Pages (from-to)	655-657
Number of pages	3
Journal	Journal of Electron Spectroscopy and Related Phenomena
Volume	144-147
DOIs	https://doi.org/10.1016/j.elspec.2005.01.099
Publication status	Published - Jun 2005
Externally published	Yes

Keywords

CePdsSn
CeRhAs
Photoemission
Strongly correlated systems

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Radiation
Atomic and Molecular Physics, and Optics
Condensed Matter Physics
Spectroscopy
Physical and Theoretical Chemistry

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10.1016/j.elspec.2005.01.099

Cite this

Sekiyama, A., Fujita, Y., Tsunekawa, M., Kasai, S., Shigemoto, A., Imada, S., Adroja, D. T., Yoshino, T., Iga, F., Takabatake, T., Nanba, T., & Suga, S. (2005). High-resolution soft X-ray photoemission study of a Kondo semiconductor and related compounds. Journal of Electron Spectroscopy and Related Phenomena, 144-147, 655-657. https://doi.org/10.1016/j.elspec.2005.01.099

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title = "High-resolution soft X-ray photoemission study of a Kondo semiconductor and related compounds",

abstract = "We have performed the bulk-sensitive high-resolution soft X-ray photoemission study of a Kondo semiconductor CeRhAs and related compounds CeNiSn and CePdSn. The comparison of the spectra of polycrystalline CePdSn on the fractured and scraped surfaces show that the fracturing of the samples is much better than the scraping in order to obtain intrinsic photoemission spectra. The Ce 4d core-level spectra show clear differences in the electronic states among the materials.",

keywords = "CePdsSn, CeRhAs, Photoemission, Strongly correlated systems",

author = "A. Sekiyama and Y. Fujita and M. Tsunekawa and S. Kasai and A. Shigemoto and S. Imada and Adroja, {D. T.} and T. Yoshino and F. Iga and T. Takabatake and T. Nanba and S. Suga",

year = "2005",

month = jun,

doi = "10.1016/j.elspec.2005.01.099",

language = "English",

volume = "144-147",

pages = "655--657",

journal = "Journal of Electron Spectroscopy and Related Phenomena",

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TY - JOUR

T1 - High-resolution soft X-ray photoemission study of a Kondo semiconductor and related compounds

AU - Sekiyama, A.

AU - Fujita, Y.

AU - Tsunekawa, M.

AU - Kasai, S.

AU - Shigemoto, A.

AU - Imada, S.

AU - Adroja, D. T.

AU - Yoshino, T.

AU - Iga, F.

AU - Takabatake, T.

AU - Nanba, T.

AU - Suga, S.

PY - 2005/6

Y1 - 2005/6

N2 - We have performed the bulk-sensitive high-resolution soft X-ray photoemission study of a Kondo semiconductor CeRhAs and related compounds CeNiSn and CePdSn. The comparison of the spectra of polycrystalline CePdSn on the fractured and scraped surfaces show that the fracturing of the samples is much better than the scraping in order to obtain intrinsic photoemission spectra. The Ce 4d core-level spectra show clear differences in the electronic states among the materials.

AB - We have performed the bulk-sensitive high-resolution soft X-ray photoemission study of a Kondo semiconductor CeRhAs and related compounds CeNiSn and CePdSn. The comparison of the spectra of polycrystalline CePdSn on the fractured and scraped surfaces show that the fracturing of the samples is much better than the scraping in order to obtain intrinsic photoemission spectra. The Ce 4d core-level spectra show clear differences in the electronic states among the materials.

KW - CePdsSn

KW - CeRhAs

KW - Photoemission

KW - Strongly correlated systems

UR - http://www.scopus.com/inward/record.url?scp=20244377059&partnerID=8YFLogxK

U2 - 10.1016/j.elspec.2005.01.099

DO - 10.1016/j.elspec.2005.01.099

M3 - Article

AN - SCOPUS:20244377059

SN - 0368-2048

VL - 144-147

SP - 655

EP - 657

JO - Journal of Electron Spectroscopy and Related Phenomena

JF - Journal of Electron Spectroscopy and Related Phenomena

ER -

High-resolution soft X-ray photoemission study of a Kondo semiconductor and related compounds

Abstract

Keywords

ASJC Scopus subject areas

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