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Fractal analysis of hillocks: A case of RF sputtered aluminum thin films
Fredrick M. Mwema
,
Esther T. Akinlabi
, Oluseyi P. Oladijo
Mechanical Engineering Science
University of Johannesburg
Botswana International University of Science and Technology
Research output
:
Contribution to journal
›
Article
›
peer-review
33
Citations (Scopus)
Overview
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Dive into the research topics of 'Fractal analysis of hillocks: A case of RF sputtered aluminum thin films'. Together they form a unique fingerprint.
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Engineering
Thin Films
100%
Multifractal
100%
Substrate Temperature
50%
Glass Substrate
50%
Fractal Dimension
50%
Deformation Mechanism
50%
Line Profile
50%
Indentation
50%
Material Science
Aluminum
100%
Nanoindentation
100%
Thin Films
100%
Density
50%
Indentation
50%
Deformation Mechanism
50%
Earth and Planetary Sciences
Thin Films
100%
Fractal Analysis
100%
Nanoindentation
100%
Power Law
50%
Deformation Mechanism
50%
Sine Wave
50%
Agricultural and Biological Sciences
Fractal Dimension
100%
Sinusoid
100%
Keyphrases
Hillocks
100%
Sinusoid
12%
Monofractal
12%
Optical Profiling
12%
Line Profiles
12%
Fractal Nature
12%
Multifractal Characteristics
12%
Indentation Impression
12%