Exploring the effect of rf power in sputtering of aluminum thin films-a microstructure analysis
- F. M. Mwema
- , E. T. Akinlabi
- , O. P. Oladijo
- University of Johannesburg
- Covenant University
- Botswana International University of Science and Technology
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1
Citation
(Scopus)