Experimental Approach for Reliability Analysis of Medium-Power Zener Diodes under DC Switching Surge Degradation

Daniel van Niekerk, Johan Venter

Electrical and Electronic Engineering Technology

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

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University of Johannesburg Researcher Publishes New Data on Electronics (Experimental Approach for Reliability Analysis of Medium-Power Zener Diodes under DC Switching Surge Degradation)
Venter, J. & van Niekerk, D.
5/06/24
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