TY - GEN
T1 - EMTP-based analysis of pre-insertion resistor and point on wave switching methodology
AU - Zondi, S.
AU - Bokoro, P.
AU - Paul, B.
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/11/18
Y1 - 2015/11/18
N2 - The switching of high-voltage capacitor banks for reactive power and voltage control usually generates significant transients. These high amplitude disturbances have a tendency to damage or reduce the lifespan of capacitor units, thus leading to complete failure of capacitor banks. Pre-insertion resistors or inductors as well as synchronous switching (Point on Wave) methods can be used to mitigate transient phenomenon. In this work, Electromagnetic Transient Program simulations of transient voltage for single and back to back capacitor banks indicate that pre-insertion resistors methodology can significantly reduce transients, and could therefore be combined with synchronous switching to effect transient mitigation.
AB - The switching of high-voltage capacitor banks for reactive power and voltage control usually generates significant transients. These high amplitude disturbances have a tendency to damage or reduce the lifespan of capacitor units, thus leading to complete failure of capacitor banks. Pre-insertion resistors or inductors as well as synchronous switching (Point on Wave) methods can be used to mitigate transient phenomenon. In this work, Electromagnetic Transient Program simulations of transient voltage for single and back to back capacitor banks indicate that pre-insertion resistors methodology can significantly reduce transients, and could therefore be combined with synchronous switching to effect transient mitigation.
KW - Capacitor banks
KW - Transient overvoltage and inrush current
KW - single and Back to back switching
UR - http://www.scopus.com/inward/record.url?scp=84962604869&partnerID=8YFLogxK
U2 - 10.1109/AFRCON.2015.7331936
DO - 10.1109/AFRCON.2015.7331936
M3 - Conference contribution
AN - SCOPUS:84962604869
T3 - IEEE AFRICON Conference
BT - Proceeding of the 2015 12th IEEE AFRICON International Conference
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 12th IEEE AFRICON International Conference, AFRICON 2015
Y2 - 14 September 2015 through 17 September 2015
ER -