Abstract
Large electron emission yields from natural p-type semiconducting, natural insulating and synthetic insulating diamond induced by light and medium ion impacts were measured, as a function of energy in the MeV range. The two insulating diamonds consistently gave smaller yields than the semiconducting diamond, which is thought to be due to surface charging. The yield from the synthetic diamond was greatly reduced possibly due to defect trapping of electrons. A theoretical model based on kinetic transport theory was used to fit the data, showing a relation between the ion-target system and the electron emission.
Original language | English |
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Pages (from-to) | 299-302 |
Number of pages | 4 |
Journal | Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms |
Volume | 219-220 |
Issue number | 1-4 |
DOIs | |
Publication status | Published - Jun 2004 |
Externally published | Yes |
Event | Proceedings of the Sixteenth International Conference on Ion - Albuquerque, NM., United States Duration: 29 Jun 2003 → 4 Jul 2003 |
Keywords
- Diamond
- Electron emission
- Ion beams
ASJC Scopus subject areas
- Nuclear and High Energy Physics
- Instrumentation