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Effect of varying low substrate temperature on sputtered aluminium films
F. M. Mwema
,
E. T. Akinlabi
, O. P. Oladijo
, Jyotsna Dutta Majumdar
Mechanical Engineering Science
University of Johannesburg
Botswana International University of Science and Technology
Indian Institute of Technology Kharagpur
Research output
:
Contribution to journal
›
Article
›
peer-review
24
Citations (Scopus)
Overview
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Engineering
Substrate Temperature
100%
Aluminum Film
100%
Young's Modulus
50%
Thin Films
50%
Melting Temperature
25%
Temperature Field
25%
Field-Emission Scanning Electron Microscopy
25%
Porosity
25%
Low-Temperature
25%
Porous Film
25%
Hardness Value
25%
Fractal Dimension
25%
Structure Surface
25%
Stainless Steel
25%
Atomic Force Microscopy
25%
Creep
25%
Contact Depth
25%
Curve Behavior
25%
Material Science
Film
100%
Aluminum
100%
Elastic Moduli
66%
Stainless Steel
33%
Amorphous Material
33%
Field Emission Scanning Electron Microscopy
33%
Surface Structure
33%
Microscopy
33%
Creep
33%
Thin Film Deposition
33%
Thin Films
33%
Keyphrases
Interconnected Structure
66%
Creep Curve
33%
Curving Behavior
33%
Area Fraction
33%
Contact Depth
33%
Average Fractal Dimension
33%