Fingerprint
Dive into the research topics of 'Effect of Lr34 Resistance on Leaf Rust Development, Grain Yield and Baking Quality in Wheat'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Effect of Lr34 Resistance on Leaf Rust Development, Grain Yield and Baking Quality in Wheat
S. C. Drijepondt, Z. A. Pretorius, D. van Lill, F. H.J. Rijkenberg
Research output: Contribution to journal › Article › peer-review
16
Citations
(Scopus)