@inproceedings{c0bf1a9384074401b8828b2004402ddc,
title = "Effect of lossy substrates on series impedance parameters of interconnects",
abstract = "The paper presents the effect of lossy silicon (Si) substrates on the frequency-dependent distributed series impedance interconnect parameters - R(ω) and L(ω). The frequency variations of these parameters of the microstrip line for four different conductivities of Si substrate are observed and compared Keysight Technologies Advanced Design System is used for the electromagnetic simulations of the microstrip line structures. Scattering parameters (S-parameters) based equations are used to plot the variations of series impedance parameters as a function offrequency.",
keywords = "Conductive substrate, S-parameters, line parameters, microstrip line, skin effect, transmission line model",
author = "Saurabh Chaturvedi and Mladen Bozanic and Saurabh Sinha",
note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 39th International Semiconductor Conference, CAS 2016 ; Conference date: 10-10-2016 Through 12-10-2016",
year = "2016",
month = dec,
day = "14",
doi = "10.1109/SMICND.2016.7783038",
language = "English",
series = "Proceedings of the International Semiconductor Conference, CAS",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "55--58",
booktitle = "2016 39th International Semiconductor Conference, CAS 2016 - Proceedings",
address = "United States",
}