Effect of gate finger on double-gate MOSFET for RF switch at 45-nm technology

Viranjay M. Srivastava, G. Singh, K. S. Yadav

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

In this paper, an independently controlled symmetrical double-gate MOSFET is analyzed, which is used for the double-pole four-throw RF CMOS switch design. This analysis emphasizes on the study of the effect of number of gate finger and their layouts for the double-gate MOSFET at 45-nm technology. This is in terms of supply voltage, gate voltage, drain current, and voltage gain. Higher drain current can be easily achieved by using higher number of gate finger which are also analyzed.

Original languageEnglish
Title of host publicationProceedings - 2011 International Conference on Communication Systems and Network Technologies, CSNT 2011
Pages464-468
Number of pages5
DOIs
Publication statusPublished - 2011
Externally publishedYes
Event2011 International Conference on Communication Systems and Network Technologies, CSNT 2011 - Katra, Jammu, India
Duration: 3 Jun 20115 Jun 2011

Publication series

NameProceedings - 2011 International Conference on Communication Systems and Network Technologies, CSNT 2011

Conference

Conference2011 International Conference on Communication Systems and Network Technologies, CSNT 2011
Country/TerritoryIndia
CityKatra, Jammu
Period3/06/115/06/11

Keywords

  • 45-nm technology
  • CMOS
  • Double-gate MOSFET
  • Gate finger
  • RF switch
  • Radio frequency
  • VLSI

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Communication

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