Effect of electro-thermally induced degradation on the capacitance of metal oxide varistors

L. Muremi, P. Bokoro

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

3 Citations (Scopus)

Abstract

In this study, changes in the capacitance of MOV-based arresters resulting from thermal stresses are analysed. Low-voltage MOV samples are artificially degraded at different thermal stresses, while the simultaneously applied ac field was kept constant. Prior to ANOVA being applied, the change in capacitance measured at room temperature, before and after degradation process, is tested for compliance with normality using Anderson-Darling test. Results show significant reduction in capacitance after electro-thermal degradation.

Original languageEnglish
Title of host publication2017 3rd International Conference on Condition Assessment Techniques in Electrical Systems, CATCON 2017 - Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages311-314
Number of pages4
ISBN (Electronic)9781538631386
DOIs
Publication statusPublished - 2 Jul 2017
Event3rd International Conference on Condition Assessment Techniques in Electrical Systems, CATCON 2017 - Rupnagar, Punjab, India
Duration: 16 Nov 201718 Nov 2017

Publication series

Name2017 3rd International Conference on Condition Assessment Techniques in Electrical Systems, CATCON 2017 - Proceedings
Volume2018-January

Conference

Conference3rd International Conference on Condition Assessment Techniques in Electrical Systems, CATCON 2017
Country/TerritoryIndia
CityRupnagar, Punjab
Period16/11/1718/11/17

Keywords

  • analysis of varience
  • capacitance
  • degradation
  • Metal Oxide varistors
  • thermal stresses

ASJC Scopus subject areas

  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality

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