@inproceedings{51d1714b513a4f48b61cfe2b6fe79330,
title = "Effect of Degeneration on a Millimeter Wave LNA: Application of Microstrip Transmission Lines",
abstract = "This paper presents the impact of a singlewire degeneration microstrip transmission line (MTL) on the gain and noise figure of a millimeter wave low noise amplifier (LNA) at 60 GHz, designed using 0.13 μm SiGe BiCMOS technology. To accomplish this, the performance of the designed LNA is varied with and without the presence of singlewire degeneration MTL in a setup at the first stage of the LNA, using a common emitter transistor topology. Initial results show that the introduction of the singlewire degeneration MTL in the schematic resulted in a decrease in the gain and an increased noise figure of the LNA, while without the presence of a singlewire MTL, the common emitter transistor of the cascode configuration gave rise to a satisfactory increase in gain and reduced noise figure for the LNA. A maximum gain of 15.91 dB and a minimum noise figure of 6.74 dB were recorded when MTL was added to the LNA circuit, while a maximum gain of 20.84 dB and a minimum noise figure of 6.16 dB was recorded when the singlewire MTL was disconnected.",
keywords = "Common emitter, Degeneration, Gain, Low noise amplifier, Millimeter wave, Noise figure, Silicon germaniμm, Singlewire Microstrip transmission line",
author = "M. Fanoro and Olokede, {S. S.} and S. Sinha",
note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 41st International Semiconductor Conference, CAS 2018 ; Conference date: 10-10-2018 Through 12-10-2018",
year = "2018",
month = nov,
day = "16",
doi = "10.1109/SMICND.2018.8539762",
language = "English",
series = "Proceedings of the International Semiconductor Conference, CAS",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "283--286",
editor = "M.A. Dinescu and D. Dobrescu and A. Muller and D. Cristea and M. Dragoman and R. Muller and M.L. Ciurea and D. Neculoiu and Gh. Brezeanu",
booktitle = "2018 41st International Semiconductor Conference, CAS 2018 - Proceedings",
address = "United States",
}