EBSD characterisation of the B2 orientation in γ-TiAl based alloy

M. N. Mathabathe, A. S. Bolokang, G. Govender, C. W. Siyasiya, R. J. Mostert

Research output: Contribution to journalConference articlepeer-review

Abstract

Electron backscattered diffraction (EBSD) has been conducted to determine the orientation relationship of the remnant B2 phase in an α-solidified γ-Ti-45Al-2Nb-0.3Si (at. %) based intermetallic alloy. The morphology and microstructural characterisation was investigated using conventional methods. The results showed that the B2-grains exhibits a Blackburn orientation relationship (BOR) with the α2 grains viz. {111}B2 // {0001}α2 and {110}B2 // {11-20}α2. Moreover, mis-orientation axes of B2-grains were found in the clusters between <101> and <111> in 57-63° angles, in the Y0 directions. In addition, it was also observed that the overall B2 grains in the alloy structure was textured and comprised of high angle boundaries of misorientations above 15° angles.

Original languageEnglish
Article number012013
JournalIOP Conference Series: Materials Science and Engineering
Volume655
Issue number1
DOIs
Publication statusPublished - 8 Nov 2019
Externally publishedYes
EventConference of the South African Advanced Materials Initiative 2019, CoSAAMI 2019 - Vanderbijlpark, South Africa
Duration: 22 Oct 201925 Oct 2019

ASJC Scopus subject areas

  • General Materials Science
  • General Engineering

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