Characterization of Y2SiO5:Ce thin films

E. Coetsee, H. C. Swart, J. J. Terblans, O. M. Ntwaeaborwa, K. T. Hillie, W. A. Jordaan, U. Buttner

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)


Uncoated and SnO2-coated Y2SiO5:Ce thin film phosphors grown on Si (1 0 0) substrates by a pulsed laser deposition technique were characterized with scanning electron microscopy (SEM), atomic force microscopy (AFM), energy dispersive X-Ray analysis (EDS) and X-Ray diffraction (XRD). Cathodoluminescence (CL) of both the uncoated and SnO2-coated thin film phosphors was investigated for possible application in low voltage field emission displays (FEDs). Blue emission with peak values at 440 and 500 nm was from spherically shaped particles distributed unevenly on the surfaces of both the uncoated and coated thin film phosphors.

Original languageEnglish
Pages (from-to)1338-1343
Number of pages6
JournalOptical Materials
Issue number11
Publication statusPublished - Jul 2007
Externally publishedYes


  • AFM
  • Cathodoluminescence
  • EDS
  • PLD
  • SEM
  • Thin films
  • XRD
  • YSiO:Ce

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Atomic and Molecular Physics, and Optics
  • Spectroscopy
  • Physical and Theoretical Chemistry
  • Organic Chemistry
  • Inorganic Chemistry
  • Electrical and Electronic Engineering


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