Characterization of sol-gel SiO₂:Ce,Tb powder and pulsed laser deposited thin film phosphors

Keyphrases

• Atomic Force Microscopy 50%
• Cathodoluminescence 50%
• Cathodoluminescence Spectroscopy 50%
• Ce3+ 50%
• Chemical Composition 50%
• Crossbeam 50%
• Laser Ablation Method 50%
• Laser Pulse 50%
• Luminescence Intensity 50%
• Luminescence Properties 50%
• Nanoparticulate 50%
• Nonradiative Energy Transfer 50%
• Photoluminescence 50%
• Pulsed Laser 100%
• Pulsed Laser Deposition 50%
• Rutherford Backscattering Spectrometry 50%
• Scanning Electron Microscopy (SEM-EDS) 50%
• Si (100) Substrate 50%
• Silica 100%
• Sol-gel SiO2 100%
• Surface Topography 50%
• Thin Film Phosphor 100%

Material Science

• Atomic Force Microscopy 20%
• Cathodoluminescence 20%
• Cathodoluminescence Spectroscopy 20%
• Film 100%
• Laser Ablation 20%
• Luminescence 40%
• Phosphor 20%
• Photoluminescence 20%
• Pulsed Laser Deposition 20%
• Scanning Electron Microscopy 20%
• Sol-Gel 100%
• Surface Topography 20%
• Thin Films 100%