Characterization of Al+-implanted LiF by a monoenergetic positron beam

E. J. Sendezera; A. T. Davidson; C. G. Fischer; S. H. Connel; J. P.F. Sellschop; W. Anwand; G. Brauer; E. M. Nicht

doi:10.1016/S0169-4332(99)00186-5

Characterization of Al⁺-implanted LiF by a monoenergetic positron beam

E. J. Sendezera, A. T. Davidson, C. G. Fischer, S. H. Connel, J. P.F. Sellschop, W. Anwand, G. Brauer, E. M. Nicht

Research output: Contribution to journal › Conference article › peer-review

2 Citations (Scopus)

Abstract

We have studied the radiation damage created by the implantation of 100 keV Al⁺ ions into LiF crystals using a monoenergetic positron beam whose energy can be varied. The fluence range investigated was 10¹³ to 10¹⁶ ions cm^-2. Pronounced effects of radiation damage are seen in the line shape of the positron spectrum. The measured S-parameter is used to characterize the radiation damage as a function of depth. A four-layer model is used to fit the data using the computer program VEPFIT. The Positron Annihilation Spectroscopy (PAS) results are correlated with optical absorption measurements on the crystals. The use of positrons to profile the radiation damage as a function of depth below the ion implantation surface is shown to be feasible for lithium fluoride crystals.

Original language	English
Pages (from-to)	125-129
Number of pages	5
Journal	Applied Surface Science
Volume	149
Issue number	1
DOIs	https://doi.org/10.1016/S0169-4332(99)00186-5
Publication status	Published - 1 Aug 1999
Externally published	Yes
Event	Proceeding of the 1998 8th International Workshop on Slow-Positron Beam Techniques fot Solids and Surfaces - Cape Town, S Afr Duration: 6 Sept 1998 → 12 Sept 1998

ASJC Scopus subject areas

General Chemistry
Condensed Matter Physics
General Physics and Astronomy
Surfaces and Interfaces
Surfaces, Coatings and Films

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10.1016/S0169-4332(99)00186-5

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title = "Characterization of Al+-implanted LiF by a monoenergetic positron beam",

abstract = "We have studied the radiation damage created by the implantation of 100 keV Al+ ions into LiF crystals using a monoenergetic positron beam whose energy can be varied. The fluence range investigated was 1013 to 1016 ions cm-2. Pronounced effects of radiation damage are seen in the line shape of the positron spectrum. The measured S-parameter is used to characterize the radiation damage as a function of depth. A four-layer model is used to fit the data using the computer program VEPFIT. The Positron Annihilation Spectroscopy (PAS) results are correlated with optical absorption measurements on the crystals. The use of positrons to profile the radiation damage as a function of depth below the ion implantation surface is shown to be feasible for lithium fluoride crystals.",

author = "Sendezera, {E. J.} and Davidson, {A. T.} and Fischer, {C. G.} and Connel, {S. H.} and Sellschop, {J. P.F.} and W. Anwand and G. Brauer and Nicht, {E. M.}",

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T1 - Characterization of Al+-implanted LiF by a monoenergetic positron beam

AU - Sendezera, E. J.

AU - Davidson, A. T.

AU - Fischer, C. G.

AU - Connel, S. H.

AU - Sellschop, J. P.F.

AU - Anwand, W.

AU - Brauer, G.

AU - Nicht, E. M.

PY - 1999/8/1

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N2 - We have studied the radiation damage created by the implantation of 100 keV Al+ ions into LiF crystals using a monoenergetic positron beam whose energy can be varied. The fluence range investigated was 1013 to 1016 ions cm-2. Pronounced effects of radiation damage are seen in the line shape of the positron spectrum. The measured S-parameter is used to characterize the radiation damage as a function of depth. A four-layer model is used to fit the data using the computer program VEPFIT. The Positron Annihilation Spectroscopy (PAS) results are correlated with optical absorption measurements on the crystals. The use of positrons to profile the radiation damage as a function of depth below the ion implantation surface is shown to be feasible for lithium fluoride crystals.

AB - We have studied the radiation damage created by the implantation of 100 keV Al+ ions into LiF crystals using a monoenergetic positron beam whose energy can be varied. The fluence range investigated was 1013 to 1016 ions cm-2. Pronounced effects of radiation damage are seen in the line shape of the positron spectrum. The measured S-parameter is used to characterize the radiation damage as a function of depth. A four-layer model is used to fit the data using the computer program VEPFIT. The Positron Annihilation Spectroscopy (PAS) results are correlated with optical absorption measurements on the crystals. The use of positrons to profile the radiation damage as a function of depth below the ion implantation surface is shown to be feasible for lithium fluoride crystals.

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ER -

Characterization of Al⁺-implanted LiF by a monoenergetic positron beam

Abstract

ASJC Scopus subject areas

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