Bond stretch isomerism in rhombic C2Si2

Pamidighantam V. Sudhakar, Osman F. Güner, Koop Lammertsma

Research output: Contribution to journalArticlepeer-review

25 Citations (Scopus)

Abstract

The differences in bonding and electronic properties between the MP/6-31G* optimized disilicon dicarbide structures 1 and 2 can be related to bond stretch isomerism, which occurs through a level-crossing mechanism. Their energy differences are calculated at the MP4 and GVB/6-31G* levels. Electron density analysis indicates concentration of charge in the center of rhombic structure 1 with some multiple bonding character between its transannular carbons. In contrast, the higher energy isomer 2 has a depletion of charge in the center relative to the circumference of the rhombic structure.

Original languageEnglish
Pages (from-to)7289-7292
Number of pages4
JournalJournal of Physical Chemistry
Volume93
Issue number21
DOIs
Publication statusPublished - 1989
Externally publishedYes

ASJC Scopus subject areas

  • General Engineering
  • Physical and Theoretical Chemistry

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