Auto-tuning of TITO decoupling controllers from step tests

Qing Guo Wang; Bin Huang; Xin Guo

doi:10.1016/S0019-0578(00)00028-8

Auto-tuning of TITO decoupling controllers from step tests

Qing Guo Wang, Bin Huang, Xin Guo

Electrical and Electronic Engineering Science

Research output: Contribution to journal › Article › peer-review

134 Citations (Scopus)

Abstract

This paper considers auto-tuning of simple lead-lag decoupler plus decentralized PI/PID controllers for effective control of two-input and two-output (TITO) processes. A new robust identification method from step tests is presented first for SISO processes and then sequentially applied to TITO processes. The resulting 1st-order plus dead-time model is used for decoupler design and the 2nd-order one is used for decentralized PID sequential tuning. The simulation is given for illustration of the proposed tuning.

Original language	English
Pages (from-to)	407-418
Number of pages	12
Journal	ISA Transactions
Volume	39
Issue number	4
DOIs	https://doi.org/10.1016/S0019-0578(00)00028-8
Publication status	Published - Sept 2000

ASJC Scopus subject areas

Control and Systems Engineering
Instrumentation
Computer Science Applications
Electrical and Electronic Engineering
Applied Mathematics

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10.1016/S0019-0578(00)00028-8

Cite this

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abstract = "This paper considers auto-tuning of simple lead-lag decoupler plus decentralized PI/PID controllers for effective control of two-input and two-output (TITO) processes. A new robust identification method from step tests is presented first for SISO processes and then sequentially applied to TITO processes. The resulting 1st-order plus dead-time model is used for decoupler design and the 2nd-order one is used for decentralized PID sequential tuning. The simulation is given for illustration of the proposed tuning.",

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AB - This paper considers auto-tuning of simple lead-lag decoupler plus decentralized PI/PID controllers for effective control of two-input and two-output (TITO) processes. A new robust identification method from step tests is presented first for SISO processes and then sequentially applied to TITO processes. The resulting 1st-order plus dead-time model is used for decoupler design and the 2nd-order one is used for decentralized PID sequential tuning. The simulation is given for illustration of the proposed tuning.

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Auto-tuning of TITO decoupling controllers from step tests

Abstract

ASJC Scopus subject areas

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