Auger electron/X-ray photoelectron and cathodoluminescent spectroscopic studies of pulsed laser ablated SrAl 2 O 4 :Eu 2+ ,Dy 3+ thin films

P. D. Nsimama, O. M. Ntwaeaborwa, H. C. Swart

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)

Abstract

Auger electron/X-ray photoelectron and cathodoluminescent (CL) spectroscopic studies were conducted on pulsed laser deposited SrAl 2 O 4 :Eu 2+ ,Dy 3+ thin films and the correlation between the surface chemical reactions and the decrease in the CL intensity was determined. The Auger electron and the CL data were collected simultaneously in a vacuum chamber either maintained at base pressure or backfilled with oxygen gas. The data were collected when the films were irradiated for 14 h with 2 keV electrons. The CL emission peak attributed to the 4f 6 5d 1 → 4f 7 transitions was observed at ∼521 nm and the CL intensity of the peaks degraded at different rates in different vacuum conditions. X-ray photoelectron spectroscopy (XPS) data collected from degraded films suggest that strontium oxide (SrO) and aliminium oxide (Al 2 O 3 ) were formed on the surface of the film as a result of electron stimulated surface chemical reaction (ESSCR).

Original languageEnglish
Pages (from-to)512-517
Number of pages6
JournalApplied Surface Science
Volume257
Issue number2
DOIs
Publication statusPublished - 1 Nov 2010
Externally publishedYes

Keywords

  • CL
  • ESSCR
  • Electron degradation

ASJC Scopus subject areas

  • General Chemistry
  • Condensed Matter Physics
  • General Physics and Astronomy
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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