Auger electron/X-ray photoelectron and cathodoluminescent spectroscopic studies of pulsed laser ablated SrAl                         2                         O                         4                         :Eu                          2+                         ,Dy                         3+                          thin films

P. D. Nsimama; O. M. Ntwaeaborwa; H. C. Swart

doi:10.1016/j.apsusc.2010.07.023

Auger electron/X-ray photoelectron and cathodoluminescent spectroscopic studies of pulsed laser ablated SrAl ₂ O ₄ :Eu ²⁺ ,Dy ³⁺ thin films

P. D. Nsimama, O. M. Ntwaeaborwa, H. C. Swart

Research output: Contribution to journal › Article › peer-review

20 Citations (Scopus)

Abstract

Auger electron/X-ray photoelectron and cathodoluminescent (CL) spectroscopic studies were conducted on pulsed laser deposited SrAl ₂ O ₄ :Eu ²⁺ ,Dy ³⁺ thin films and the correlation between the surface chemical reactions and the decrease in the CL intensity was determined. The Auger electron and the CL data were collected simultaneously in a vacuum chamber either maintained at base pressure or backfilled with oxygen gas. The data were collected when the films were irradiated for 14 h with 2 keV electrons. The CL emission peak attributed to the 4f ⁶ 5d ¹ → 4f ⁷ transitions was observed at ∼521 nm and the CL intensity of the peaks degraded at different rates in different vacuum conditions. X-ray photoelectron spectroscopy (XPS) data collected from degraded films suggest that strontium oxide (SrO) and aliminium oxide (Al ₂ O ₃ ) were formed on the surface of the film as a result of electron stimulated surface chemical reaction (ESSCR).

Original language	English
Pages (from-to)	512-517
Number of pages	6
Journal	Applied Surface Science
Volume	257
Issue number	2
DOIs	https://doi.org/10.1016/j.apsusc.2010.07.023
Publication status	Published - 1 Nov 2010
Externally published	Yes

Keywords

CL
ESSCR
Electron degradation

ASJC Scopus subject areas

General Chemistry
Condensed Matter Physics
General Physics and Astronomy
Surfaces and Interfaces
Surfaces, Coatings and Films

Access to Document

10.1016/j.apsusc.2010.07.023

Cite this

Nsimama, P. D., Ntwaeaborwa, O. M., & Swart, H. C. (2010). Auger electron/X-ray photoelectron and cathodoluminescent spectroscopic studies of pulsed laser ablated SrAl ₂ O ₄ :Eu ²⁺ ,Dy ³⁺ thin films Applied Surface Science, 257(2), 512-517. https://doi.org/10.1016/j.apsusc.2010.07.023

Nsimama, P. D. ; Ntwaeaborwa, O. M. ; Swart, H. C. / Auger electron/X-ray photoelectron and cathodoluminescent spectroscopic studies of pulsed laser ablated SrAl ₂ O ₄ :Eu ²⁺ ,Dy ³⁺ thin films In: Applied Surface Science. 2010 ; Vol. 257, No. 2. pp. 512-517.

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title = " Auger electron/X-ray photoelectron and cathodoluminescent spectroscopic studies of pulsed laser ablated SrAl 2 O 4 :Eu 2+ ,Dy 3+ thin films ",

abstract = " Auger electron/X-ray photoelectron and cathodoluminescent (CL) spectroscopic studies were conducted on pulsed laser deposited SrAl 2 O 4 :Eu 2+ ,Dy 3+ thin films and the correlation between the surface chemical reactions and the decrease in the CL intensity was determined. The Auger electron and the CL data were collected simultaneously in a vacuum chamber either maintained at base pressure or backfilled with oxygen gas. The data were collected when the films were irradiated for 14 h with 2 keV electrons. The CL emission peak attributed to the 4f 6 5d 1 → 4f 7 transitions was observed at ∼521 nm and the CL intensity of the peaks degraded at different rates in different vacuum conditions. X-ray photoelectron spectroscopy (XPS) data collected from degraded films suggest that strontium oxide (SrO) and aliminium oxide (Al 2 O 3 ) were formed on the surface of the film as a result of electron stimulated surface chemical reaction (ESSCR).",

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Nsimama, PD, Ntwaeaborwa, OM & Swart, HC 2010, ' Auger electron/X-ray photoelectron and cathodoluminescent spectroscopic studies of pulsed laser ablated SrAl ₂ O ₄ :Eu ²⁺ ,Dy ³⁺ thin films ', Applied Surface Science, vol. 257, no. 2, pp. 512-517. https://doi.org/10.1016/j.apsusc.2010.07.023

Auger electron/X-ray photoelectron and cathodoluminescent spectroscopic studies of pulsed laser ablated SrAl ₂ O ₄ :Eu ²⁺ ,Dy ³⁺ thin films . / Nsimama, P. D.; Ntwaeaborwa, O. M.; Swart, H. C.
In: Applied Surface Science, Vol. 257, No. 2, 01.11.2010, p. 512-517.

Research output: Contribution to journal › Article › peer-review

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AU - Nsimama, P. D.

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AU - Swart, H. C.

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N2 - Auger electron/X-ray photoelectron and cathodoluminescent (CL) spectroscopic studies were conducted on pulsed laser deposited SrAl 2 O 4 :Eu 2+ ,Dy 3+ thin films and the correlation between the surface chemical reactions and the decrease in the CL intensity was determined. The Auger electron and the CL data were collected simultaneously in a vacuum chamber either maintained at base pressure or backfilled with oxygen gas. The data were collected when the films were irradiated for 14 h with 2 keV electrons. The CL emission peak attributed to the 4f 6 5d 1 → 4f 7 transitions was observed at ∼521 nm and the CL intensity of the peaks degraded at different rates in different vacuum conditions. X-ray photoelectron spectroscopy (XPS) data collected from degraded films suggest that strontium oxide (SrO) and aliminium oxide (Al 2 O 3 ) were formed on the surface of the film as a result of electron stimulated surface chemical reaction (ESSCR).

AB - Auger electron/X-ray photoelectron and cathodoluminescent (CL) spectroscopic studies were conducted on pulsed laser deposited SrAl 2 O 4 :Eu 2+ ,Dy 3+ thin films and the correlation between the surface chemical reactions and the decrease in the CL intensity was determined. The Auger electron and the CL data were collected simultaneously in a vacuum chamber either maintained at base pressure or backfilled with oxygen gas. The data were collected when the films were irradiated for 14 h with 2 keV electrons. The CL emission peak attributed to the 4f 6 5d 1 → 4f 7 transitions was observed at ∼521 nm and the CL intensity of the peaks degraded at different rates in different vacuum conditions. X-ray photoelectron spectroscopy (XPS) data collected from degraded films suggest that strontium oxide (SrO) and aliminium oxide (Al 2 O 3 ) were formed on the surface of the film as a result of electron stimulated surface chemical reaction (ESSCR).

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Nsimama PD, Ntwaeaborwa OM, Swart HC. Auger electron/X-ray photoelectron and cathodoluminescent spectroscopic studies of pulsed laser ablated SrAl ₂ O ₄ :Eu ²⁺ ,Dy ³⁺ thin films Applied Surface Science. 2010 Nov 1;257(2):512-517. doi: 10.1016/j.apsusc.2010.07.023