Auger electron spectroscopy study and depth profile analyses of the CaS:Eu2+ pulsed laser deposited thin luminescent films

R. L. Nyenge; H. C. Swart; O. M. Ntwaeaborwa

doi:10.1007/s00339-016-0135-3

Auger electron spectroscopy study and depth profile analyses of the CaS:Eu²⁺ pulsed laser deposited thin luminescent films

R. L. Nyenge, H. C. Swart, O. M. Ntwaeaborwa

Research output: Contribution to journal › Article › peer-review

4 Citations (Scopus)

Abstract

This paper presents the results of a study of the chemical composition, depth profile analyses of pulsed laser deposited CaS:Eu²⁺ thin films grown at different substrate temperatures. Using Auger electron spectroscopy, we have shown that the thin film grown in an argon atmosphere shows sulfur deficiency as the substrate temperature is increased from 200 to 650 °C.

Original language	English
Article number	621
Pages (from-to)	1-6
Number of pages	6
Journal	Applied Physics A: Materials Science and Processing
Volume	122
Issue number	6
DOIs	https://doi.org/10.1007/s00339-016-0135-3
Publication status	Published - 1 Jun 2016
Externally published	Yes

ASJC Scopus subject areas

General Chemistry
General Materials Science

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10.1007/s00339-016-0135-3

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abstract = "This paper presents the results of a study of the chemical composition, depth profile analyses of pulsed laser deposited CaS:Eu2+ thin films grown at different substrate temperatures. Using Auger electron spectroscopy, we have shown that the thin film grown in an argon atmosphere shows sulfur deficiency as the substrate temperature is increased from 200 to 650 °C.",

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AB - This paper presents the results of a study of the chemical composition, depth profile analyses of pulsed laser deposited CaS:Eu2+ thin films grown at different substrate temperatures. Using Auger electron spectroscopy, we have shown that the thin film grown in an argon atmosphere shows sulfur deficiency as the substrate temperature is increased from 200 to 650 °C.

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Auger electron spectroscopy study and depth profile analyses of the CaS:Eu²⁺ pulsed laser deposited thin luminescent films

Abstract

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