Atomic layer deposited (ALD) TiO2 and TiO2-x-N x thin film photocatalysts in salicylic acid decomposition

S. H. Vilhunen, M. E.T. Sillanpää

Research output: Contribution to journalArticlepeer-review

15 Citations (Scopus)

Abstract

Degradation of salicylic acid (SA) with thin film photocatalyst, titanium dioxide (TiO2) and nitrogen-doped TiO2 (TiO 2-x-Nx) combined with ultraviolet (UV) radiation was studied. TiO2 film with thickness of 15 and 65nm was tested. The TiO2-x-Nx film had thickness of 15nm on top of TiO 2 (50 nm). Photocatalysts were prepared on glass substrate by atomic layer deposition (ALD) technique. The effect of initial pH (3-10) was studied with SA concentration of 10 mg/l. Decomposition of SA was fastest at pH 6 with both films and the rate was equal at initial pH values 3 and 4.3. However, at higher pH values the non-doped film was more efficient.

Original languageEnglish
Pages (from-to)2471-2475
Number of pages5
JournalWater Science and Technology
Volume60
Issue number10
DOIs
Publication statusPublished - 2009
Externally publishedYes

Keywords

  • Atomic layer deposition
  • Nitrogen-doping
  • Salicylic acid
  • Titanium dioxide
  • Ultraviolet light

ASJC Scopus subject areas

  • Environmental Engineering
  • Water Science and Technology

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